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Structural and optical studies of (Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films deposited at different technological conditions

(Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films were deposited upon a quartz substrate by
 rapid thermal evaporation at temperatures 1050, 1200, and 1350 °C. Structural studies of
 the as-deposited thin films were carried out by scanning electron microscopy and atomic
 force microscopy. It...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2014
Hauptverfasser: Studenyak, I.P., Neimet, Yu.Yu., Rati, Y.Y., Buchuk, M.Yu., Kökényesi, S., Daróci, L., Bohdan, R.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2014
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/118484
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Structural and optical studies of (Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films deposited at different technological conditions / I.P. Studenyak, Yu.Yu. Neimet, Y.Y. Rati, M.Yu. Buchuk, S. Kokenyesi, L. Daroci, R. Bohdan // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 3. — С. 232-236. — Бібліогр.: 20 назв. — англ.

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