The electrical resistance of spatially varied magnetic interface. The role of normal scattering

We investigate the diffusive electron transport in conductors with spatially inhomogeneous magnetic properties taking into account both impurity and normal scattering. It is found that the additional interface resistance that arises due to the magnetic inhomogeneity depends essentially on their spat...

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Опубліковано в: :Физика низких температур
Дата:2011
Автори: Gurzhi, R.N., Kalinenko, A.N., Kopeliovich, A.I., Pyshkin, P.V., Yanovsky, A.V.
Формат: Стаття
Мова:Російська
Опубліковано: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2011
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Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/118493
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:The electrical resistance of spatially varied magnetic interface. The role of normal scattering / R.N. Gurzhi, A.N. Kalinenko, A.I. Kopeliovich, P.V. Pyshkin, A.V. Yanovsky // Физика низких температур. — 2011. — Т. 37, № 2. — С. 186–194. — Бібліогр.: 13 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
_version_ 1862588310983016448
author Gurzhi, R.N.
Kalinenko, A.N.
Kopeliovich, A.I.
Pyshkin, P.V.
Yanovsky, A.V.
author_facet Gurzhi, R.N.
Kalinenko, A.N.
Kopeliovich, A.I.
Pyshkin, P.V.
Yanovsky, A.V.
citation_txt The electrical resistance of spatially varied magnetic interface. The role of normal scattering / R.N. Gurzhi, A.N. Kalinenko, A.I. Kopeliovich, P.V. Pyshkin, A.V. Yanovsky // Физика низких температур. — 2011. — Т. 37, № 2. — С. 186–194. — Бібліогр.: 13 назв. — англ.
collection DSpace DC
container_title Физика низких температур
description We investigate the diffusive electron transport in conductors with spatially inhomogeneous magnetic properties taking into account both impurity and normal scattering. It is found that the additional interface resistance that arises due to the magnetic inhomogeneity depends essentially on their spatial characteristics. The resistance is proportional to the spin flip time in the case when the magnetic properties of the conducting system vary smoothly enough along the sample. It can be used to direct experimental investigation of spin flip processes. In the opposite case, when magnetic characteristics are varied sharply, the additional resistance depends essentially on the difference of magnetic properties of the sides far from the interface region. The resistance increases as the frequency of the electron-electron scattering increases. We consider also two types of smooth interfaces: (i) between fully spin-polarized magnetics and usual magnetic (or non-magnetic) conductors, and (ii) between two fully oppositely polarized magnetic conductors. It is shown that the interface resistance is very sensitive to appearing of the fully spin-polarized state under the applied external field.
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last_indexed 2025-11-27T01:28:41Z
publishDate 2011
publisher Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
record_format dspace
spelling Gurzhi, R.N.
Kalinenko, A.N.
Kopeliovich, A.I.
Pyshkin, P.V.
Yanovsky, A.V.
2017-05-30T14:12:23Z
2017-05-30T14:12:23Z
2011
The electrical resistance of spatially varied magnetic interface. The role of normal scattering / R.N. Gurzhi, A.N. Kalinenko, A.I. Kopeliovich, P.V. Pyshkin, A.V. Yanovsky // Физика низких температур. — 2011. — Т. 37, № 2. — С. 186–194. — Бібліогр.: 13 назв. — англ.
0132-6414
PACS: 72.25.Mk, 73.40.Cg
https://nasplib.isofts.kiev.ua/handle/123456789/118493
We investigate the diffusive electron transport in conductors with spatially inhomogeneous magnetic properties taking into account both impurity and normal scattering. It is found that the additional interface resistance that arises due to the magnetic inhomogeneity depends essentially on their spatial characteristics. The resistance is proportional to the spin flip time in the case when the magnetic properties of the conducting system vary smoothly enough along the sample. It can be used to direct experimental investigation of spin flip processes. In the opposite case, when magnetic characteristics are varied sharply, the additional resistance depends essentially on the difference of magnetic properties of the sides far from the interface region. The resistance increases as the frequency of the electron-electron scattering increases. We consider also two types of smooth interfaces: (i) between fully spin-polarized magnetics and usual magnetic (or non-magnetic) conductors, and (ii) between two fully oppositely polarized magnetic conductors. It is shown that the interface resistance is very sensitive to appearing of the fully spin-polarized state under the applied external field.
The work was supported in part by NanoProgram of the NAS of Ukraine and NASU Grant F26-2.
ru
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
Физика низких температур
Электронные свойства проводящих систем
The electrical resistance of spatially varied magnetic interface. The role of normal scattering
Article
published earlier
spellingShingle The electrical resistance of spatially varied magnetic interface. The role of normal scattering
Gurzhi, R.N.
Kalinenko, A.N.
Kopeliovich, A.I.
Pyshkin, P.V.
Yanovsky, A.V.
Электронные свойства проводящих систем
title The electrical resistance of spatially varied magnetic interface. The role of normal scattering
title_full The electrical resistance of spatially varied magnetic interface. The role of normal scattering
title_fullStr The electrical resistance of spatially varied magnetic interface. The role of normal scattering
title_full_unstemmed The electrical resistance of spatially varied magnetic interface. The role of normal scattering
title_short The electrical resistance of spatially varied magnetic interface. The role of normal scattering
title_sort electrical resistance of spatially varied magnetic interface. the role of normal scattering
topic Электронные свойства проводящих систем
topic_facet Электронные свойства проводящих систем
url https://nasplib.isofts.kiev.ua/handle/123456789/118493
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