Optical and structural studies of phase transformations and composition fluctuations at annealing of Zn₁₋xCdxO films grown by dc magnetron sputtering
Ternary Zn₁₋xCdxO (x < 0.12) alloy crystalline films with highly preferred orientation (002) have been successfully deposited on sapphire c-Al₂O₃ substrates using the direct current (dc) reactive magnetron sputtering technique and annealed at temperature 600 °C in air. The structural and optic...
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| Опубліковано в: : | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Дата: | 2014 |
| Автори: | , , , , , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2014
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| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/118505 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Optical and structural studies of phase transformations and composition fluctuations at annealing of Zn₁₋xCdxO films grown by dc magnetron sputtering / O. Kolomys, A. Romanyuk, V. Strelchuk, G. Lashkarev, O. Khyzhun, I. Timofeeva, V. Lazorenko, V. Khomyak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 3. — С. 275-283. — Бібліогр.: 28 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
nasplib_isofts_kiev_ua-123456789-118505 |
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Kolomys, O. Romanyuk, A. Strelchuk, V. Lashkarev, G. Khyzhun, O. Timofeeva, I. Lazorenko, V. Khomyak, V. 2017-05-30T14:22:28Z 2017-05-30T14:22:28Z 2014 Optical and structural studies of phase transformations and composition fluctuations at annealing of Zn₁₋xCdxO films grown by dc magnetron sputtering / O. Kolomys, A. Romanyuk, V. Strelchuk, G. Lashkarev, O. Khyzhun, I. Timofeeva, V. Lazorenko, V. Khomyak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 3. — С. 275-283. — Бібліогр.: 28 назв. — англ. 1560-8034 PACS 61.05.cp, 64.75.St, 78.30.Fs, 79.60.-i https://nasplib.isofts.kiev.ua/handle/123456789/118505 Ternary Zn₁₋xCdxO (x < 0.12) alloy crystalline films with highly preferred orientation (002) have been successfully deposited on sapphire c-Al₂O₃ substrates using the direct current (dc) reactive magnetron sputtering technique and annealed at temperature 600 °C in air. The structural and optical properties of Zn₁₋xCdxO thin films were systematically studied using X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), micro-Raman and photoluminescent (PL) spectroscopy. XPS measurements clearly confirmed Cd incorporation into ZnO lattice. XRD data revealed that the growth of wurtzite Zn₁₋xCdxO films occurs preferentially in the (002) direction. Also, when the Cd content is increased, the XRD peaks shift towards smaller angles and the full width at half-maximum of the lines increases. When the Cd content increases, LO A1 ( Zn₁₋CdxO )-like Raman modes show composition dependent frequency decrease and asymmetrical broadening. The near band-edge PL emission at room temperature shifts gradually to lower energies as the Cd content increases and reaches 2.68 eV for the highest Cd content (x = 0.12). The analysis of NBE band emission and Raman LO A1 ( Zn₁₋xCdxO ) mode shows that at a higher Cd content the coexistence of Zn₁₋xCdxO areas with different concentrations of Cd inside the same film occurs. The presence of CdO in annealed Zn₁₋xCdxO films with the higher Cd content was confirmed by Raman spectra of cubic CdO nanoinclusions. The XRD data also revealed phase segregation of cubic CdO in annealed Zn₁₋xCdxO films (Tann = 600 °C) for x ≥ 0.013. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Optical and structural studies of phase transformations and composition fluctuations at annealing of Zn₁₋xCdxO films grown by dc magnetron sputtering Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Optical and structural studies of phase transformations and composition fluctuations at annealing of Zn₁₋xCdxO films grown by dc magnetron sputtering |
| spellingShingle |
Optical and structural studies of phase transformations and composition fluctuations at annealing of Zn₁₋xCdxO films grown by dc magnetron sputtering Kolomys, O. Romanyuk, A. Strelchuk, V. Lashkarev, G. Khyzhun, O. Timofeeva, I. Lazorenko, V. Khomyak, V. |
| title_short |
Optical and structural studies of phase transformations and composition fluctuations at annealing of Zn₁₋xCdxO films grown by dc magnetron sputtering |
| title_full |
Optical and structural studies of phase transformations and composition fluctuations at annealing of Zn₁₋xCdxO films grown by dc magnetron sputtering |
| title_fullStr |
Optical and structural studies of phase transformations and composition fluctuations at annealing of Zn₁₋xCdxO films grown by dc magnetron sputtering |
| title_full_unstemmed |
Optical and structural studies of phase transformations and composition fluctuations at annealing of Zn₁₋xCdxO films grown by dc magnetron sputtering |
| title_sort |
optical and structural studies of phase transformations and composition fluctuations at annealing of zn₁₋xcdxo films grown by dc magnetron sputtering |
| author |
Kolomys, O. Romanyuk, A. Strelchuk, V. Lashkarev, G. Khyzhun, O. Timofeeva, I. Lazorenko, V. Khomyak, V. |
| author_facet |
Kolomys, O. Romanyuk, A. Strelchuk, V. Lashkarev, G. Khyzhun, O. Timofeeva, I. Lazorenko, V. Khomyak, V. |
| publishDate |
2014 |
| language |
English |
| container_title |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| format |
Article |
| description |
Ternary Zn₁₋xCdxO (x < 0.12) alloy crystalline films with highly preferred
orientation (002) have been successfully deposited on sapphire c-Al₂O₃ substrates using
the direct current (dc) reactive magnetron sputtering technique and annealed at
temperature 600 °C in air. The structural and optical properties of Zn₁₋xCdxO thin films
were systematically studied using X-ray photoelectron spectroscopy (XPS), X-ray
diffraction (XRD), micro-Raman and photoluminescent (PL) spectroscopy. XPS
measurements clearly confirmed Cd incorporation into ZnO lattice. XRD data revealed
that the growth of wurtzite Zn₁₋xCdxO films occurs preferentially in the (002) direction.
Also, when the Cd content is increased, the XRD peaks shift towards smaller angles and
the full width at half-maximum of the lines increases. When the Cd content increases,
LO A1 ( Zn₁₋CdxO )-like Raman modes show composition dependent frequency decrease
and asymmetrical broadening. The near band-edge PL emission at room temperature
shifts gradually to lower energies as the Cd content increases and reaches 2.68 eV for the
highest Cd content (x = 0.12). The analysis of NBE band emission and Raman LO A1 ( Zn₁₋xCdxO ) mode shows that at a higher Cd content the coexistence of
Zn₁₋xCdxO areas with different concentrations of Cd inside the same film occurs. The
presence of CdO in annealed Zn₁₋xCdxO films with the higher Cd content was
confirmed by Raman spectra of cubic CdO nanoinclusions. The XRD data also revealed
phase segregation of cubic CdO in annealed Zn₁₋xCdxO films (Tann = 600 °C) for
x ≥ 0.013.
|
| issn |
1560-8034 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/118505 |
| citation_txt |
Optical and structural studies of phase transformations and composition fluctuations at annealing of Zn₁₋xCdxO films grown by dc magnetron sputtering / O. Kolomys, A. Romanyuk, V. Strelchuk, G. Lashkarev, O. Khyzhun, I. Timofeeva, V. Lazorenko, V. Khomyak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 3. — С. 275-283. — Бібліогр.: 28 назв. — англ. |
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| first_indexed |
2025-12-07T17:46:16Z |
| last_indexed |
2025-12-07T17:46:16Z |
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