A model for non-thermal action of microwave radiation on oxide film/semiconductor structures

A model is considered that explains mechanism of non-thermal action of microwave radiation on the thin SiO₂ (ТiO₂, Er₂O₃, Gd₂O₃) film/SiC and SiO₂/GaAs structures. It assumes that the centers of electron-hole recombination are redistributed because of resonance interaction between dislocations of...

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2014
Main Author: Okhrimenko, O.B.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2014
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/118513
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:A model for non-thermal action of microwave radiation on oxide film/semiconductor structures / O.B. Okhrimenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 3. — С. 227-231. — Бібліогр.: 26 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-118513
record_format dspace
spelling Okhrimenko, O.B.
2017-05-30T14:27:20Z
2017-05-30T14:27:20Z
2014
A model for non-thermal action of microwave radiation on oxide film/semiconductor structures / O.B. Okhrimenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 3. — С. 227-231. — Бібліогр.: 26 назв. — англ.
1560-8034
PACS 78.70.Fy, 78.70.Gq
https://nasplib.isofts.kiev.ua/handle/123456789/118513
A model is considered that explains mechanism of non-thermal action of microwave radiation on the thin SiO₂ (ТiO₂, Er₂O₃, Gd₂O₃) film/SiC and SiO₂/GaAs structures. It assumes that the centers of electron-hole recombination are redistributed because of resonance interaction between dislocations of certain length and microwave radiation. As a result, additional bands appear in photoluminescence (PL) spectra of the oxide film/SiC structures or intensities of some bands are redistributed in the PL spectra of the SiO₂/GaAs structure, as well as optical density of the oxide film/SiC structures changes.
The author is indebted to Prof. A.M. Svetlichnyi for his interest in this work and valuable discussions
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
A model for non-thermal action of microwave radiation on oxide film/semiconductor structures
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title A model for non-thermal action of microwave radiation on oxide film/semiconductor structures
spellingShingle A model for non-thermal action of microwave radiation on oxide film/semiconductor structures
Okhrimenko, O.B.
title_short A model for non-thermal action of microwave radiation on oxide film/semiconductor structures
title_full A model for non-thermal action of microwave radiation on oxide film/semiconductor structures
title_fullStr A model for non-thermal action of microwave radiation on oxide film/semiconductor structures
title_full_unstemmed A model for non-thermal action of microwave radiation on oxide film/semiconductor structures
title_sort model for non-thermal action of microwave radiation on oxide film/semiconductor structures
author Okhrimenko, O.B.
author_facet Okhrimenko, O.B.
publishDate 2014
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description A model is considered that explains mechanism of non-thermal action of microwave radiation on the thin SiO₂ (ТiO₂, Er₂O₃, Gd₂O₃) film/SiC and SiO₂/GaAs structures. It assumes that the centers of electron-hole recombination are redistributed because of resonance interaction between dislocations of certain length and microwave radiation. As a result, additional bands appear in photoluminescence (PL) spectra of the oxide film/SiC structures or intensities of some bands are redistributed in the PL spectra of the SiO₂/GaAs structure, as well as optical density of the oxide film/SiC structures changes.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/118513
citation_txt A model for non-thermal action of microwave radiation on oxide film/semiconductor structures / O.B. Okhrimenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2014. — Т. 17, № 3. — С. 227-231. — Бібліогр.: 26 назв. — англ.
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AT okhrimenkoob modelfornonthermalactionofmicrowaveradiationonoxidefilmsemiconductorstructures
first_indexed 2025-12-01T19:42:06Z
last_indexed 2025-12-01T19:42:06Z
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