Occupation preference values in doped CmIm' multinaries from EXAFS and FTIR correlative analysis

• Published in: Физика низких температур
• Date: 2011
• Main Authors: Robouch, B.V., Marcelli, A., Robouch, P., Kisiel, A.
• Format: Article
• Language: English
• Published: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2011
• Subjects: XVIII Уральская международная зимняя школа по физике полупроводников
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/118525
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Occupation preference values in doped CmIm' multinaries from EXAFS and FTIR correlative analysis / B.V. Robouch, A. Marcelli, P. Robouch, A. Kisiel // Физика низких температур. — 2011. — Т. 37, № 3. — С. 308–312. — Бібліогр.: 25 назв. — англ.

We discuss which x-ray absorption fine structure (EXAFS) data of binary doped CmIm' compound structures can be unfolded to determine elemental bond distances and the deviations from random configurations due to site preference occupations (SOPs). SOP-deviation estimations can be further confirm...