Magnetic susceptibility of n- and p-Si single crystals containing thermodonors

Using a series of experimental methods (Hall effect, electron paramagnetic
 resonance and magnetic susceptibility (MS, χ)) comparison has been made for the
 kinetics of formation inherent to different types of thermodonors (TDs) (doubly-charged
 and shallow ones) under therma...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2010
Hauptverfasser: Babich, V.М., Luchkevych, M.M., Tsmots, V.M.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2010
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/118557
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Zitieren:Magnetic susceptibility of n- and p-Si single crystals containing thermodonors / V.М. Babich, M.M. Luchkevych, V.M. Tsmots // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 4. — С. 384-388. — Бібліогр.: 12 назв. — англ.

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_version_ 1862666535486619648
author Babich, V.М.
Luchkevych, M.M.
Tsmots, V.M.
author_facet Babich, V.М.
Luchkevych, M.M.
Tsmots, V.M.
citation_txt Magnetic susceptibility of n- and p-Si single crystals containing thermodonors / V.М. Babich, M.M. Luchkevych, V.M. Tsmots // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 4. — С. 384-388. — Бібліогр.: 12 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description Using a series of experimental methods (Hall effect, electron paramagnetic
 resonance and magnetic susceptibility (MS, χ)) comparison has been made for the
 kinetics of formation inherent to different types of thermodonors (TDs) (doubly-charged
 and shallow ones) under thermal treatments (TT) at 450 °C with the kinetics of
 paramagnetic center accumulation in the samples obtained by the MS method. The
 absence of correlation between these dependences has been shown. The dependences
 χ(H) obtained both at 300 and 77 K that have orientation and paramagnetic component
 determine neither of these two kinds of TD-centers as it was in the case of 450 °C TT for
 p-Si(B) samples where the χ
 par component is determined by the concentration of deep
 TDs (Еі ≥ 0.2 еV). The χ(H) value in the n-Si(P) samples after TT at 450 °C is
 determined, evidently, by intermediate non-stable complexes, as well as by those formed
 during rapid cooling the samples
first_indexed 2025-12-07T15:20:23Z
format Article
fulltext
id nasplib_isofts_kiev_ua-123456789-118557
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 1560-8034
language English
last_indexed 2025-12-07T15:20:23Z
publishDate 2010
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Babich, V.М.
Luchkevych, M.M.
Tsmots, V.M.
2017-05-30T16:11:51Z
2017-05-30T16:11:51Z
2010
Magnetic susceptibility of n- and p-Si single crystals containing thermodonors / V.М. Babich, M.M. Luchkevych, V.M. Tsmots // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 4. — С. 384-388. — Бібліогр.: 12 назв. — англ.
1560-8034
PACS 75.20.-g, 75.30.Cr, 75.40.Cx
https://nasplib.isofts.kiev.ua/handle/123456789/118557
Using a series of experimental methods (Hall effect, electron paramagnetic
 resonance and magnetic susceptibility (MS, χ)) comparison has been made for the
 kinetics of formation inherent to different types of thermodonors (TDs) (doubly-charged
 and shallow ones) under thermal treatments (TT) at 450 °C with the kinetics of
 paramagnetic center accumulation in the samples obtained by the MS method. The
 absence of correlation between these dependences has been shown. The dependences
 χ(H) obtained both at 300 and 77 K that have orientation and paramagnetic component
 determine neither of these two kinds of TD-centers as it was in the case of 450 °C TT for
 p-Si(B) samples where the χ
 par component is determined by the concentration of deep
 TDs (Еі ≥ 0.2 еV). The χ(H) value in the n-Si(P) samples after TT at 450 °C is
 determined, evidently, by intermediate non-stable complexes, as well as by those formed
 during rapid cooling the samples
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Magnetic susceptibility of n- and p-Si single crystals containing thermodonors
Article
published earlier
spellingShingle Magnetic susceptibility of n- and p-Si single crystals containing thermodonors
Babich, V.М.
Luchkevych, M.M.
Tsmots, V.M.
title Magnetic susceptibility of n- and p-Si single crystals containing thermodonors
title_full Magnetic susceptibility of n- and p-Si single crystals containing thermodonors
title_fullStr Magnetic susceptibility of n- and p-Si single crystals containing thermodonors
title_full_unstemmed Magnetic susceptibility of n- and p-Si single crystals containing thermodonors
title_short Magnetic susceptibility of n- and p-Si single crystals containing thermodonors
title_sort magnetic susceptibility of n- and p-si single crystals containing thermodonors
url https://nasplib.isofts.kiev.ua/handle/123456789/118557
work_keys_str_mv AT babichvm magneticsusceptibilityofnandpsisinglecrystalscontainingthermodonors
AT luchkevychmm magneticsusceptibilityofnandpsisinglecrystalscontainingthermodonors
AT tsmotsvm magneticsusceptibilityofnandpsisinglecrystalscontainingthermodonors