Methods of cluster analysis in sensor engineering: advantages and faults

• Veröffentlicht in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Datum: 2010
• Hauptverfasser: Burlachenko, Yu.V., Snopok, B.A.
• Format: Artikel
• Sprache: Englisch
• Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2010
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/118565
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: Methods of cluster analysis in sensor engineering: advantages and faults / Yu.V. Burlachenko, B.A. Snopok // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 4. — С. 393-397. — Бібліогр.: 13 назв. — англ.

We consider the crisp and fuzzy partitioning techniques of cluster analysis bearing in mind their application for classification of data obtained with chemical sensor arrays. The advantage of the cluster analysis techniques is existence of a parameter S(i). This parameter gives quantitative effic...