Selective unequal-thickness thin-film filters for IR spectral region
A new five-layer structure of the dielectric interference filter for the infra-red region of spectrum is investigated. The main spectral parameters of such a narrow-band filter are determined. The dependence of the transmission band half-width on the thickness of a dividing layer in this system i...
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Datum: | 2008 |
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2008
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/118585 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Selective unequal-thickness thin-film filters for IR spectral region / I.Ya. Yaremchuk, V.M. Fitio, Ya.V. Bobitski // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 1. — С. 23-25. — Бібліогр.: 11 назв. — англ. |
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