APA (7th ed.) Citation

Kravets, V., & Gorbov, I. (2008). Using ellipsometry methods for depth analyzing the optical disc data layer relief structures. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Kravets, V.G, and I.V Gorbov. "Using Ellipsometry Methods for Depth Analyzing the Optical Disc Data Layer Relief Structures." Semiconductor Physics Quantum Electronics & Optoelectronics 2008.

MLA (8th ed.) Citation

Kravets, V.G, and I.V Gorbov. "Using Ellipsometry Methods for Depth Analyzing the Optical Disc Data Layer Relief Structures." Semiconductor Physics Quantum Electronics & Optoelectronics, 2008.

Warning: These citations may not always be 100% accurate.