Bi₂Te₃-хSex 〈Ag〉 (х = 0.04) nanocrystal formation
The results of experimental researches dealing with formation of nanometricsize doped (Ag) layers on the surface (0001) between Te⁽¹⁾–Te⁽¹⁾ telluride quintet layers in Bi₂Te₃-хSex 〈Ag〉 (х = 0.04) crystals under directed crystallization has been submitted. During the crystal growth as result of impur...
Збережено в:
| Опубліковано в: : | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Дата: | 2009 |
| Автори: | , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2009
|
| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/118605 |
| Теги: |
Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
|
| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Bi₂Te₃-хSex 〈Ag〉 (х = 0.04) nanocrystal formation / F.K. Aleskerov, S.K. Kahramanov, М.М. Asadov, K.S. Kahramanov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 1. — С. 72-76. — Бібліогр.: 4 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| Резюме: | The results of experimental researches dealing with formation of nanometricsize doped (Ag) layers on the surface (0001) between Te⁽¹⁾–Te⁽¹⁾ telluride quintet layers in Bi₂Te₃-хSex 〈Ag〉 (х = 0.04) crystals under directed crystallization has been submitted. During the crystal growth as result of impurity diffusion along a surface (0001), accumulation, redistribution and nanocrystal formation between Te⁽¹⁾–Te⁽¹⁾ layers occur. By the method of atomic-force microscopy, the Bi₂Te₃-хSex 〈Ag〉 crystal images with nanolayers were obtained. Being based on experimental data, the fractal dimension of nanocrystalline layers was estimated.
|
|---|---|
| ISSN: | 1560-8034 |