Testing the optical methods by using the multi-level holographic grating

In this work the interaction peculiarities of electro-magnetic optical range radiation with gratings’ surfaces are investigated. The multilevel diffractive holographic grating is proposed to be used for the polarization optical methods testing. This object allowed to obtain simultaneous visualiza...

Повний опис

Збережено в:
Бібліографічні деталі
Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:2009
Автори: Barchuk, О.I., Braginets, Y.V., Klimov, O.S., Oberemok, Y.A., Savenkov, S.N.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2009
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/118614
Теги: Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Testing the optical methods by using the multi-level holographic grating / О.I.Barchuk, Y.V.Braginets, O.S.Klimov, Y.A.Oberemok, S.N.Savenkov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 1. — С. 57-63. — Бібліогр.: 18 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-118614
record_format dspace
spelling Barchuk, О.I.
Braginets, Y.V.
Klimov, O.S.
Oberemok, Y.A.
Savenkov, S.N.
2017-05-30T17:27:25Z
2017-05-30T17:27:25Z
2009
Testing the optical methods by using the multi-level holographic grating / О.I.Barchuk, Y.V.Braginets, O.S.Klimov, Y.A.Oberemok, S.N.Savenkov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 1. — С. 57-63. — Бібліогр.: 18 назв. — англ.
1560-8034
PACS 81.16.Nd, 85.40.Hp
https://nasplib.isofts.kiev.ua/handle/123456789/118614
In this work the interaction peculiarities of electro-magnetic optical range radiation with gratings’ surfaces are investigated. The multilevel diffractive holographic grating is proposed to be used for the polarization optical methods testing. This object allowed to obtain simultaneous visualization of different spatial frequencies and to estimate both structure and surface peculiarities when working with 3D-objects. Using this additional information one can remove uncertainty in solution of the inverse problem of ellipsometry related with ellipsometric angles periodicity. Thereby, multiangle ellipsometry allowing investigation of the specular reflection component could be used to study submicron peculiarities of the object. We have also presented the basic aspects of ellipsometric method optimization. It was shown that anisotropy parameters, such as linear amplitude anisotropy and linear phase anisotropy, obtained from ellipsometric measurements are the most effective to ascertain the submicron characteristic dimension of material.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Testing the optical methods by using the multi-level holographic grating
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Testing the optical methods by using the multi-level holographic grating
spellingShingle Testing the optical methods by using the multi-level holographic grating
Barchuk, О.I.
Braginets, Y.V.
Klimov, O.S.
Oberemok, Y.A.
Savenkov, S.N.
title_short Testing the optical methods by using the multi-level holographic grating
title_full Testing the optical methods by using the multi-level holographic grating
title_fullStr Testing the optical methods by using the multi-level holographic grating
title_full_unstemmed Testing the optical methods by using the multi-level holographic grating
title_sort testing the optical methods by using the multi-level holographic grating
author Barchuk, О.I.
Braginets, Y.V.
Klimov, O.S.
Oberemok, Y.A.
Savenkov, S.N.
author_facet Barchuk, О.I.
Braginets, Y.V.
Klimov, O.S.
Oberemok, Y.A.
Savenkov, S.N.
publishDate 2009
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description In this work the interaction peculiarities of electro-magnetic optical range radiation with gratings’ surfaces are investigated. The multilevel diffractive holographic grating is proposed to be used for the polarization optical methods testing. This object allowed to obtain simultaneous visualization of different spatial frequencies and to estimate both structure and surface peculiarities when working with 3D-objects. Using this additional information one can remove uncertainty in solution of the inverse problem of ellipsometry related with ellipsometric angles periodicity. Thereby, multiangle ellipsometry allowing investigation of the specular reflection component could be used to study submicron peculiarities of the object. We have also presented the basic aspects of ellipsometric method optimization. It was shown that anisotropy parameters, such as linear amplitude anisotropy and linear phase anisotropy, obtained from ellipsometric measurements are the most effective to ascertain the submicron characteristic dimension of material.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/118614
citation_txt Testing the optical methods by using the multi-level holographic grating / О.I.Barchuk, Y.V.Braginets, O.S.Klimov, Y.A.Oberemok, S.N.Savenkov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 1. — С. 57-63. — Бібліогр.: 18 назв. — англ.
work_keys_str_mv AT barchukoi testingtheopticalmethodsbyusingthemultilevelholographicgrating
AT braginetsyv testingtheopticalmethodsbyusingthemultilevelholographicgrating
AT klimovos testingtheopticalmethodsbyusingthemultilevelholographicgrating
AT oberemokya testingtheopticalmethodsbyusingthemultilevelholographicgrating
AT savenkovsn testingtheopticalmethodsbyusingthemultilevelholographicgrating
first_indexed 2025-12-01T14:16:32Z
last_indexed 2025-12-01T14:16:32Z
_version_ 1850860418494365696