Shack-hartmann wavefront sensor with holographic lenslet array for the aberration measurements in a speckle field
The application of a Shack-Hartmann sensor with holographic lenslet array to the measurements of wavefront aberrations in a speckle field is offered. The main feature of the method is that the tested wave front can be compared with an arbitrary wavefront preliminary recorded in the holographic me...
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Datum: | 2008 |
| Hauptverfasser: | , , , , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2008
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/118671 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Shack-hartmann wavefront sensor with holographic lenslet array for the aberration measurements in a speckle field / D.V. Podanchuk, V.N. Kurashov, V.P. Dan'ko, M.M. Kotov, N.S. Sutyagina // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 1. — С. 29-33. — Бібліогр.: 7 назв. — англ. |
Institution
Digital Library of Periodicals of National Academy of Sciences of Ukraine| Zusammenfassung: | The application of a Shack-Hartmann sensor with holographic lenslet array to
the measurements of wavefront aberrations in a speckle field is offered. The main feature
of the method is that the tested wave front can be compared with an arbitrary wavefront
preliminary recorded in the holographic memory of the array. An iterative algorithm of
the sensor work for measuring the variable speckled wavefronts is offered. The
experimental results of measurements of the curvature of a spherical speckled wave are
presented. The possibility to use the method proposed in the analysis of deformations of
a rough surface is shown.
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| ISSN: | 1560-8034 |