New features of surface plasmon resonance detected by modulation of electromagnetic radiation polarization
Using a technique based on modulation of electromagnetic radiation polarization, we studied the features of surface plasmon resonance in gold nanofilms deposited onto the surface of a totally reflecting prism (fused quartz). The angular characteristics of the polarization difference of squares of...
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Datum: | 2008 |
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| Format: | Artikel |
| Sprache: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2008
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/118674 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | New features of surface plasmon resonance detected by modulation of electromagnetic radiation polarization / L.J. Berezhinsky, I.E. Matyash, S.P. Rudenko, B.К. Serdega // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 1. — С. 63-69. — Бібліогр.: 18 назв. — англ. |
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Berezhinsky, L.J. Matyash, I.E. Rudenko, S.P. Serdega, B.K. 2017-05-30T19:21:07Z 2017-05-30T19:21:07Z 2008 New features of surface plasmon resonance detected by modulation of electromagnetic radiation polarization / L.J. Berezhinsky, I.E. Matyash, S.P. Rudenko, B.К. Serdega // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 1. — С. 63-69. — Бібліогр.: 18 назв. — англ. 1560-8034 PACS 73.20.Мf https://nasplib.isofts.kiev.ua/handle/123456789/118674 Using a technique based on modulation of electromagnetic radiation polarization, we studied the features of surface plasmon resonance in gold nanofilms deposited onto the surface of a totally reflecting prism (fused quartz). The angular characteristics of the polarization difference of squares of the reflectance coefficient modules for s- and p-polarized radiation, ∆ρ =|Rs|² − |Rp|² , were measured (at a wavelength λ = 0.63 µm) for metal films whose thickness varied from 0 up to 120 nm. Contrary to the results given by the traditional techniques, the characteristics of ∆ρ peak under the resonance condition. As a result, two nonresonance components were found in these characteristics. The values and shapes of their angular dependences are determined by the coefficients of internal reflection from the metal and insulator that depend on the film thickness. Application of a model with exponential dependence of the refraction and extinction coefficients on the metal film thickness led to agreement between the results of calculation from the Fresnel formulas and those obtained experimentally. It was found that characteristic parameter of the exponential corresponds to the metal film thickness value of 11±0.5 nm. The authors are grateful to S.A. Zynyo for sample preparation and O.S. Lytvyn for AFM studies of the samples. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics New features of surface plasmon resonance detected by modulation of electromagnetic radiation polarization Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
New features of surface plasmon resonance detected by modulation of electromagnetic radiation polarization |
| spellingShingle |
New features of surface plasmon resonance detected by modulation of electromagnetic radiation polarization Berezhinsky, L.J. Matyash, I.E. Rudenko, S.P. Serdega, B.K. |
| title_short |
New features of surface plasmon resonance detected by modulation of electromagnetic radiation polarization |
| title_full |
New features of surface plasmon resonance detected by modulation of electromagnetic radiation polarization |
| title_fullStr |
New features of surface plasmon resonance detected by modulation of electromagnetic radiation polarization |
| title_full_unstemmed |
New features of surface plasmon resonance detected by modulation of electromagnetic radiation polarization |
| title_sort |
new features of surface plasmon resonance detected by modulation of electromagnetic radiation polarization |
| author |
Berezhinsky, L.J. Matyash, I.E. Rudenko, S.P. Serdega, B.K. |
| author_facet |
Berezhinsky, L.J. Matyash, I.E. Rudenko, S.P. Serdega, B.K. |
| publishDate |
2008 |
| language |
English |
| container_title |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| format |
Article |
| description |
Using a technique based on modulation of electromagnetic radiation
polarization, we studied the features of surface plasmon resonance in gold nanofilms
deposited onto the surface of a totally reflecting prism (fused quartz). The angular
characteristics of the polarization difference of squares of the reflectance coefficient
modules for s- and p-polarized radiation,
∆ρ =|Rs|² − |Rp|² , were measured (at a wavelength
λ = 0.63 µm) for metal films whose thickness varied from 0 up to 120 nm.
Contrary to the results given by the traditional techniques, the characteristics of ∆ρ peak
under the resonance condition. As a result, two nonresonance components were found in
these characteristics. The values and shapes of their angular dependences are determined
by the coefficients of internal reflection from the metal and insulator that depend on the
film thickness. Application of a model with exponential dependence of the refraction and
extinction coefficients on the metal film thickness led to agreement between the results
of calculation from the Fresnel formulas and those obtained experimentally. It was found
that characteristic parameter of the exponential corresponds to the metal film thickness
value of 11±0.5 nm.
|
| issn |
1560-8034 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/118674 |
| citation_txt |
New features of surface plasmon resonance detected by modulation of electromagnetic radiation polarization / L.J. Berezhinsky, I.E. Matyash, S.P. Rudenko, B.К. Serdega // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 1. — С. 63-69. — Бібліогр.: 18 назв. — англ. |
| work_keys_str_mv |
AT berezhinskylj newfeaturesofsurfaceplasmonresonancedetectedbymodulationofelectromagneticradiationpolarization AT matyashie newfeaturesofsurfaceplasmonresonancedetectedbymodulationofelectromagneticradiationpolarization AT rudenkosp newfeaturesofsurfaceplasmonresonancedetectedbymodulationofelectromagneticradiationpolarization AT serdegabk newfeaturesofsurfaceplasmonresonancedetectedbymodulationofelectromagneticradiationpolarization |
| first_indexed |
2025-12-07T19:44:41Z |
| last_indexed |
2025-12-07T19:44:41Z |
| _version_ |
1850879960599756800 |