The features of surface plasmon resonance in gold cluster films

• Published in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Date: 2009
• Main Authors: Maksimenko, L.S., Matyash, I.E., Rudenko, S.P., Serdega, B.K.
• Format: Article
• Language: English
• Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2009
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/118687
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: The features of surface plasmon resonance in gold cluster films / L.S. Maksimenko, I.E. Matyash, S.P. Rudenko, B.K. Serdega // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 2. — С. 129-134. — Бібліогр.: 13 назв. — англ.

The internal reflection of nanosized gold cluster films was studied using the technique of polarization modulation of electromagnetic radiation in the Kretschmann geometry. We measured the reflection coefficients Rs and Rp of s- and p-polarized radiation, respectively, as well as their polarization difference ∆R = Rs − Rp, as function of the light incidence angle in the 0.4÷1.6 µm wavelength range. A topological size effect was found; it consists in dependence of the value and sign of curvature of the polarization difference characteristics on the film surface properties. It is shown that the sign of curvature of ∆R characteristics depends on the radiation wavelength λ and indicates resonance interaction with a metal film of either p-polarized radiation only or that of both polarizations. The spectral characteristic of the topological size effect in the resonance interaction is obtained from the condition of isotropic reflection, ∆R = Rs − Rp = 0, and its dependence on the radiation wavelength.