The features of surface plasmon resonance in gold cluster films

• Опубліковано в: : Semiconductor Physics Quantum Electronics & Optoelectronics
• Дата: 2009
• Автори: Maksimenko, L.S., Matyash, I.E., Rudenko, S.P., Serdega, B.K.
• Формат: Стаття
• Мова: Англійська
• Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2009
• Онлайн доступ: https://nasplib.isofts.kiev.ua/handle/123456789/118687
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: The features of surface plasmon resonance in gold cluster films / L.S. Maksimenko, I.E. Matyash, S.P. Rudenko, B.K. Serdega // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 2. — С. 129-134. — Бібліогр.: 13 назв. — англ.

The internal reflection of nanosized gold cluster films was studied using the
 technique of polarization modulation of electromagnetic radiation in the Kretschmann
 geometry. We measured the reflection coefficients Rs and Rp of s- and p-polarized
 radiation, respectively, as well as their polarization difference ∆R = Rs − Rp, as function
 of the light incidence angle in the 0.4÷1.6 µm wavelength range. A topological size
 effect was found; it consists in dependence of the value and sign of curvature of the
 polarization difference characteristics on the film surface properties. It is shown that the
 sign of curvature of ∆R characteristics depends on the radiation wavelength λ and
 indicates resonance interaction with a metal film of either p-polarized radiation only or
 that of both polarizations. The spectral characteristic of the topological size effect in the
 resonance interaction is obtained from the condition of isotropic reflection, ∆R = Rs − Rp
 = 0, and its dependence on the radiation wavelength.