Donets, V., Melnichenko, L., Shaykevich, I., & Lomakina, O. (2009). Determination of refractive index dispersion and thickness of thin antireflection films TiO₂ and Si₃N₄ on surfaces of silicon photoelectric converters. Semiconductor Physics Quantum Electronics & Optoelectronics.
Чикаго стиль цитування (17-те видання)Donets, V.V, L.Y Melnichenko, I.A Shaykevich, та O.V Lomakina. "Determination of Refractive Index Dispersion and Thickness of Thin Antireflection Films TiO₂ and Si₃N₄ on Surfaces of Silicon Photoelectric Converters." Semiconductor Physics Quantum Electronics & Optoelectronics 2009.
Стиль цитування MLA (8-ме видання)Donets, V.V, et al. "Determination of Refractive Index Dispersion and Thickness of Thin Antireflection Films TiO₂ and Si₃N₄ on Surfaces of Silicon Photoelectric Converters." Semiconductor Physics Quantum Electronics & Optoelectronics, 2009.