Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate
We have investigated optical properties of films of gold nanoparticles on
 Si/SiO₂ substrate by using the method of spectroscopic ellipsometry in dependence on
 morphology of the films. Different morphology of the films was obtained by flashannealing
 at various temperatures...
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| Published in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Date: | 2012 |
| Main Authors: | , , , |
| Format: | Article |
| Language: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2012
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| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/118718 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate / E.G. Bortchagovsky, V.Z. Lozovski, T.O. Mishakova, K. Hingerl // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 360-364. — Бібліогр.: 9 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862681112148443136 |
|---|---|
| author | Bortchagovsky, E.G. Lozovski, V.Z. Mishakova, T.O. Hingerl, K. |
| author_facet | Bortchagovsky, E.G. Lozovski, V.Z. Mishakova, T.O. Hingerl, K. |
| citation_txt | Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate / E.G. Bortchagovsky, V.Z. Lozovski, T.O. Mishakova, K. Hingerl // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 360-364. — Бібліогр.: 9 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | We have investigated optical properties of films of gold nanoparticles on
Si/SiO₂ substrate by using the method of spectroscopic ellipsometry in dependence on
morphology of the films. Different morphology of the films was obtained by flashannealing
at various temperatures of identical sputtered thin gold layers. Ellipsometric
spectra were compared with account of pictures of the films obtained by scanned electron
microscopy. Remarkable dependence of depolarization of the reflected light with the
frequency of localized plasmon resonance versus the film morphology was found.
|
| first_indexed | 2025-12-07T15:48:54Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-118718 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-12-07T15:48:54Z |
| publishDate | 2012 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Bortchagovsky, E.G. Lozovski, V.Z. Mishakova, T.O. Hingerl, K. 2017-05-31T05:13:21Z 2017-05-31T05:13:21Z 2012 Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate / E.G. Bortchagovsky, V.Z. Lozovski, T.O. Mishakova, K. Hingerl // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 360-364. — Бібліогр.: 9 назв. — англ. 1560-8034 PACS 42.25.Ja, 73.21.-b, 78.67.Bf, 78.68.+m https://nasplib.isofts.kiev.ua/handle/123456789/118718 We have investigated optical properties of films of gold nanoparticles on
 Si/SiO₂ substrate by using the method of spectroscopic ellipsometry in dependence on
 morphology of the films. Different morphology of the films was obtained by flashannealing
 at various temperatures of identical sputtered thin gold layers. Ellipsometric
 spectra were compared with account of pictures of the films obtained by scanned electron
 microscopy. Remarkable dependence of depolarization of the reflected light with the
 frequency of localized plasmon resonance versus the film morphology was found. We are indebted to Thomas Senoy (University
 Chemnitz, Germany) for the preparation of samples and
 to Günter Hesser (ZONA, Johannes Kepler University
 Linz, Austria) for the scanning electron microscopy of
 the samples. We appreciate the visiting fellowship of the
 Institute of Physics of the Academy of Sciences of the
 Czech Republic. Partially this work was supported by
 the program of the Ukrainian-Austrian cooperation,
 grants M/432-2011 and M/231-2012 of the State agency
 on sciences, innovations and informatization of Ukraine. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate Article published earlier |
| spellingShingle | Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate Bortchagovsky, E.G. Lozovski, V.Z. Mishakova, T.O. Hingerl, K. |
| title | Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate |
| title_full | Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate |
| title_fullStr | Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate |
| title_full_unstemmed | Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate |
| title_short | Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate |
| title_sort | spectral-ellipsometric examining the films of gold nanoparticles on si/sio₂ substrate |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/118718 |
| work_keys_str_mv | AT bortchagovskyeg spectralellipsometricexaminingthefilmsofgoldnanoparticlesonsisio2substrate AT lozovskivz spectralellipsometricexaminingthefilmsofgoldnanoparticlesonsisio2substrate AT mishakovato spectralellipsometricexaminingthefilmsofgoldnanoparticlesonsisio2substrate AT hingerlk spectralellipsometricexaminingthefilmsofgoldnanoparticlesonsisio2substrate |