Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate

We have investigated optical properties of films of gold nanoparticles on
 Si/SiO₂ substrate by using the method of spectroscopic ellipsometry in dependence on
 morphology of the films. Different morphology of the films was obtained by flashannealing
 at various temperatures...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2012
Hauptverfasser: Bortchagovsky, E.G., Lozovski, V.Z., Mishakova, T.O., Hingerl, K.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2012
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/118718
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Zitieren:Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate / E.G. Bortchagovsky, V.Z. Lozovski, T.O. Mishakova, K. Hingerl // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 360-364. — Бібліогр.: 9 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Bortchagovsky, E.G.
Lozovski, V.Z.
Mishakova, T.O.
Hingerl, K.
author_facet Bortchagovsky, E.G.
Lozovski, V.Z.
Mishakova, T.O.
Hingerl, K.
citation_txt Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate / E.G. Bortchagovsky, V.Z. Lozovski, T.O. Mishakova, K. Hingerl // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 360-364. — Бібліогр.: 9 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description We have investigated optical properties of films of gold nanoparticles on
 Si/SiO₂ substrate by using the method of spectroscopic ellipsometry in dependence on
 morphology of the films. Different morphology of the films was obtained by flashannealing
 at various temperatures of identical sputtered thin gold layers. Ellipsometric
 spectra were compared with account of pictures of the films obtained by scanned electron
 microscopy. Remarkable dependence of depolarization of the reflected light with the
 frequency of localized plasmon resonance versus the film morphology was found.
first_indexed 2025-12-07T15:48:54Z
format Article
fulltext
id nasplib_isofts_kiev_ua-123456789-118718
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 1560-8034
language English
last_indexed 2025-12-07T15:48:54Z
publishDate 2012
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Bortchagovsky, E.G.
Lozovski, V.Z.
Mishakova, T.O.
Hingerl, K.
2017-05-31T05:13:21Z
2017-05-31T05:13:21Z
2012
Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate / E.G. Bortchagovsky, V.Z. Lozovski, T.O. Mishakova, K. Hingerl // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 360-364. — Бібліогр.: 9 назв. — англ.
1560-8034
PACS 42.25.Ja, 73.21.-b, 78.67.Bf, 78.68.+m
https://nasplib.isofts.kiev.ua/handle/123456789/118718
We have investigated optical properties of films of gold nanoparticles on
 Si/SiO₂ substrate by using the method of spectroscopic ellipsometry in dependence on
 morphology of the films. Different morphology of the films was obtained by flashannealing
 at various temperatures of identical sputtered thin gold layers. Ellipsometric
 spectra were compared with account of pictures of the films obtained by scanned electron
 microscopy. Remarkable dependence of depolarization of the reflected light with the
 frequency of localized plasmon resonance versus the film morphology was found.
We are indebted to Thomas Senoy (University
 Chemnitz, Germany) for the preparation of samples and
 to Günter Hesser (ZONA, Johannes Kepler University
 Linz, Austria) for the scanning electron microscopy of
 the samples. We appreciate the visiting fellowship of the
 Institute of Physics of the Academy of Sciences of the
 Czech Republic. Partially this work was supported by
 the program of the Ukrainian-Austrian cooperation,
 grants M/432-2011 and M/231-2012 of the State agency
 on sciences, innovations and informatization of Ukraine.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate
Article
published earlier
spellingShingle Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate
Bortchagovsky, E.G.
Lozovski, V.Z.
Mishakova, T.O.
Hingerl, K.
title Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate
title_full Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate
title_fullStr Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate
title_full_unstemmed Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate
title_short Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate
title_sort spectral-ellipsometric examining the films of gold nanoparticles on si/sio₂ substrate
url https://nasplib.isofts.kiev.ua/handle/123456789/118718
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AT lozovskivz spectralellipsometricexaminingthefilmsofgoldnanoparticlesonsisio2substrate
AT mishakovato spectralellipsometricexaminingthefilmsofgoldnanoparticlesonsisio2substrate
AT hingerlk spectralellipsometricexaminingthefilmsofgoldnanoparticlesonsisio2substrate