Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate
We have investigated optical properties of films of gold nanoparticles on Si/SiO₂ substrate by using the method of spectroscopic ellipsometry in dependence on morphology of the films. Different morphology of the films was obtained by flashannealing at various temperatures of identical sputtered t...
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| Опубліковано в: : | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Дата: | 2012 |
| Автори: | , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2012
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| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/118718 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate / E.G. Bortchagovsky, V.Z. Lozovski, T.O. Mishakova, K. Hingerl // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 360-364. — Бібліогр.: 9 назв. — англ. |
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nasplib_isofts_kiev_ua-123456789-118718 |
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Bortchagovsky, E.G. Lozovski, V.Z. Mishakova, T.O. Hingerl, K. 2017-05-31T05:13:21Z 2017-05-31T05:13:21Z 2012 Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate / E.G. Bortchagovsky, V.Z. Lozovski, T.O. Mishakova, K. Hingerl // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 360-364. — Бібліогр.: 9 назв. — англ. 1560-8034 PACS 42.25.Ja, 73.21.-b, 78.67.Bf, 78.68.+m https://nasplib.isofts.kiev.ua/handle/123456789/118718 We have investigated optical properties of films of gold nanoparticles on Si/SiO₂ substrate by using the method of spectroscopic ellipsometry in dependence on morphology of the films. Different morphology of the films was obtained by flashannealing at various temperatures of identical sputtered thin gold layers. Ellipsometric spectra were compared with account of pictures of the films obtained by scanned electron microscopy. Remarkable dependence of depolarization of the reflected light with the frequency of localized plasmon resonance versus the film morphology was found. We are indebted to Thomas Senoy (University Chemnitz, Germany) for the preparation of samples and to Günter Hesser (ZONA, Johannes Kepler University Linz, Austria) for the scanning electron microscopy of the samples. We appreciate the visiting fellowship of the Institute of Physics of the Academy of Sciences of the Czech Republic. Partially this work was supported by the program of the Ukrainian-Austrian cooperation, grants M/432-2011 and M/231-2012 of the State agency on sciences, innovations and informatization of Ukraine. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate |
| spellingShingle |
Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate Bortchagovsky, E.G. Lozovski, V.Z. Mishakova, T.O. Hingerl, K. |
| title_short |
Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate |
| title_full |
Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate |
| title_fullStr |
Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate |
| title_full_unstemmed |
Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate |
| title_sort |
spectral-ellipsometric examining the films of gold nanoparticles on si/sio₂ substrate |
| author |
Bortchagovsky, E.G. Lozovski, V.Z. Mishakova, T.O. Hingerl, K. |
| author_facet |
Bortchagovsky, E.G. Lozovski, V.Z. Mishakova, T.O. Hingerl, K. |
| publishDate |
2012 |
| language |
English |
| container_title |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| format |
Article |
| description |
We have investigated optical properties of films of gold nanoparticles on
Si/SiO₂ substrate by using the method of spectroscopic ellipsometry in dependence on
morphology of the films. Different morphology of the films was obtained by flashannealing
at various temperatures of identical sputtered thin gold layers. Ellipsometric
spectra were compared with account of pictures of the films obtained by scanned electron
microscopy. Remarkable dependence of depolarization of the reflected light with the
frequency of localized plasmon resonance versus the film morphology was found.
|
| issn |
1560-8034 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/118718 |
| citation_txt |
Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate / E.G. Bortchagovsky, V.Z. Lozovski, T.O. Mishakova, K. Hingerl // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 360-364. — Бібліогр.: 9 назв. — англ. |
| work_keys_str_mv |
AT bortchagovskyeg spectralellipsometricexaminingthefilmsofgoldnanoparticlesonsisio2substrate AT lozovskivz spectralellipsometricexaminingthefilmsofgoldnanoparticlesonsisio2substrate AT mishakovato spectralellipsometricexaminingthefilmsofgoldnanoparticlesonsisio2substrate AT hingerlk spectralellipsometricexaminingthefilmsofgoldnanoparticlesonsisio2substrate |
| first_indexed |
2025-12-07T15:48:54Z |
| last_indexed |
2025-12-07T15:48:54Z |
| _version_ |
1850865127203536896 |