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Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate

We have investigated optical properties of films of gold nanoparticles on Si/SiO₂ substrate by using the method of spectroscopic ellipsometry in dependence on morphology of the films. Different morphology of the films was obtained by flashannealing at various temperatures of identical sputtered t...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2012
Hauptverfasser: Bortchagovsky, E.G., Lozovski, V.Z., Mishakova, T.O., Hingerl, K.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2012
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/118718
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate / E.G. Bortchagovsky, V.Z. Lozovski, T.O. Mishakova, K. Hingerl // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 360-364. — Бібліогр.: 9 назв. — англ.

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