Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate

• Veröffentlicht in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Datum: 2012
• Hauptverfasser: Bortchagovsky, E.G., Lozovski, V.Z., Mishakova, T.O., Hingerl, K.
• Format: Artikel
• Sprache: Englisch
• Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2012
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/118718
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO₂ substrate / E.G. Bortchagovsky, V.Z. Lozovski, T.O. Mishakova, K. Hingerl // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 360-364. — Бібліогр.: 9 назв. — англ.

We have investigated optical properties of films of gold nanoparticles on
 Si/SiO₂ substrate by using the method of spectroscopic ellipsometry in dependence on
 morphology of the films. Different morphology of the films was obtained by flashannealing
 at various temperatures...