Perspectives for using technology of laser thermolithography

Analyzed in this work are the requirements to an optical system for laser thermolithographic recording. It has been shown that possibilities of this type recording with decreasing the registered element sizes can be realized only when using special measures for stabilizing both exposing radiation...

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Бібліографічні деталі
Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:2012
Автори: Kryuchyn, A.A., Lapchuk, A.S., Bryts’kyi, A.I., Kostyukevych, S.O.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2012
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/118722
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Perspectives for using technology of laser thermolithography / A.A. Kryuchyn, A.S. Lapchuk, A.I. Bryts’kyi, S.O. Kostyukevych // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 328-332. — Бібліогр.: 9 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-118722
record_format dspace
spelling Kryuchyn, A.A.
Lapchuk, A.S.
Bryts’kyi, A.I.
Kostyukevych, S.O.
2017-05-31T05:17:12Z
2017-05-31T05:17:12Z
2012
Perspectives for using technology of laser thermolithography / A.A. Kryuchyn, A.S. Lapchuk, A.I. Bryts’kyi, S.O. Kostyukevych // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 328-332. — Бібліогр.: 9 назв. — англ.
1560-8034
PACS 81.16.Nd
https://nasplib.isofts.kiev.ua/handle/123456789/118722
Analyzed in this work are the requirements to an optical system for laser thermolithographic recording. It has been shown that possibilities of this type recording with decreasing the registered element sizes can be realized only when using special measures for stabilizing both exposing radiation power and duration of laser pulses. Using the thermolithographic method for making super-dense patterns also requires creation of a specific system for dynamic focusing with accuracy better than 100 nm. It has been shown that the specific heat of thermochemical reaction and thermal resistance of a substrate are critical parameters for this method.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Perspectives for using technology of laser thermolithography
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Perspectives for using technology of laser thermolithography
spellingShingle Perspectives for using technology of laser thermolithography
Kryuchyn, A.A.
Lapchuk, A.S.
Bryts’kyi, A.I.
Kostyukevych, S.O.
title_short Perspectives for using technology of laser thermolithography
title_full Perspectives for using technology of laser thermolithography
title_fullStr Perspectives for using technology of laser thermolithography
title_full_unstemmed Perspectives for using technology of laser thermolithography
title_sort perspectives for using technology of laser thermolithography
author Kryuchyn, A.A.
Lapchuk, A.S.
Bryts’kyi, A.I.
Kostyukevych, S.O.
author_facet Kryuchyn, A.A.
Lapchuk, A.S.
Bryts’kyi, A.I.
Kostyukevych, S.O.
publishDate 2012
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description Analyzed in this work are the requirements to an optical system for laser thermolithographic recording. It has been shown that possibilities of this type recording with decreasing the registered element sizes can be realized only when using special measures for stabilizing both exposing radiation power and duration of laser pulses. Using the thermolithographic method for making super-dense patterns also requires creation of a specific system for dynamic focusing with accuracy better than 100 nm. It has been shown that the specific heat of thermochemical reaction and thermal resistance of a substrate are critical parameters for this method.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/118722
citation_txt Perspectives for using technology of laser thermolithography / A.A. Kryuchyn, A.S. Lapchuk, A.I. Bryts’kyi, S.O. Kostyukevych // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 328-332. — Бібліогр.: 9 назв. — англ.
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