X-ray dosimetry of copper-doped CdGa₂S₄ single crystals

Comparative analysis of the X-ray dosimetric characteristics of CdGa₂S₄ and CdGa₂S₄<Cu> single crystals demonstrates that after copper-doping the persistence of the crystal characteristics completely disappears. The current-dose characteristics Ir ~ E tend to linearity (α = 1) at low dos...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2012
Hauptverfasser: Mustafaeva, S.N., Asadov, M.M., Guseinov, D.T.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2012
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/118727
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:X-ray dosimetry of copper-doped CdGa₂S₄ single crystals / S.N. Mustafaeva, M.M. Asadov, D.T. Guseinov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 358-359. — Бібліогр.: 4 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-118727
record_format dspace
spelling Mustafaeva, S.N.
Asadov, M.M.
Guseinov, D.T.
2017-05-31T05:23:35Z
2017-05-31T05:23:35Z
2012
X-ray dosimetry of copper-doped CdGa₂S₄ single crystals / S.N. Mustafaeva, M.M. Asadov, D.T. Guseinov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 358-359. — Бібліогр.: 4 назв. — англ.
1560-8034
https://nasplib.isofts.kiev.ua/handle/123456789/118727
PACS 71.20.Nr, 72.15.Cz, 72.20.Jv, 72.80.Jc
Comparative analysis of the X-ray dosimetric characteristics of CdGa₂S₄ and CdGa₂S₄<Cu> single crystals demonstrates that after copper-doping the persistence of the crystal characteristics completely disappears. The current-dose characteristics Ir ~ E tend to linearity (α = 1) at low dose rates of X-rays. At high dose rates, α tends to 0.5, which testifies to the mechanism of quadratic recombination of charge carriers generated by X-rays in CdGa₂S₄<Cu>.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
X-ray dosimetry of copper-doped CdGa₂S₄ single crystals
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title X-ray dosimetry of copper-doped CdGa₂S₄ single crystals
spellingShingle X-ray dosimetry of copper-doped CdGa₂S₄ single crystals
Mustafaeva, S.N.
Asadov, M.M.
Guseinov, D.T.
title_short X-ray dosimetry of copper-doped CdGa₂S₄ single crystals
title_full X-ray dosimetry of copper-doped CdGa₂S₄ single crystals
title_fullStr X-ray dosimetry of copper-doped CdGa₂S₄ single crystals
title_full_unstemmed X-ray dosimetry of copper-doped CdGa₂S₄ single crystals
title_sort x-ray dosimetry of copper-doped cdga₂s₄ single crystals
author Mustafaeva, S.N.
Asadov, M.M.
Guseinov, D.T.
author_facet Mustafaeva, S.N.
Asadov, M.M.
Guseinov, D.T.
publishDate 2012
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description Comparative analysis of the X-ray dosimetric characteristics of CdGa₂S₄ and CdGa₂S₄<Cu> single crystals demonstrates that after copper-doping the persistence of the crystal characteristics completely disappears. The current-dose characteristics Ir ~ E tend to linearity (α = 1) at low dose rates of X-rays. At high dose rates, α tends to 0.5, which testifies to the mechanism of quadratic recombination of charge carriers generated by X-rays in CdGa₂S₄<Cu>.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/118727
citation_txt X-ray dosimetry of copper-doped CdGa₂S₄ single crystals / S.N. Mustafaeva, M.M. Asadov, D.T. Guseinov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 358-359. — Бібліогр.: 4 назв. — англ.
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first_indexed 2025-12-07T15:41:16Z
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