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X-ray dosimetry of copper-doped CdGa₂S₄ single crystals

Comparative analysis of the X-ray dosimetric characteristics of CdGa₂S₄ and CdGa₂S₄<Cu> single crystals demonstrates that after copper-doping the persistence of the crystal characteristics completely disappears. The current-dose characteristics Ir ~ E tend to linearity (α = 1) at low dos...

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Bibliographic Details
Published in:	Semiconductor Physics Quantum Electronics & Optoelectronics
Date:	2012
Main Authors:	Mustafaeva, S.N., Asadov, M.M., Guseinov, D.T.
Format:	Article
Language:	English
Published:	Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2012
Online Access:	https://nasplib.isofts.kiev.ua/handle/123456789/118727
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Journal Title:	Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:	X-ray dosimetry of copper-doped CdGa₂S₄ single crystals / S.N. Mustafaeva, M.M. Asadov, D.T. Guseinov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 4. — С. 358-359. — Бібліогр.: 4 назв. — англ.

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