Gaidar, G. (2009). On methodology of measuring parameters with the increased sensitivity to residual or irradiation induced inhomogeneities in semiconductors. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago-Zitierstil (17. Ausg.)Gaidar, G.P. "On Methodology of Measuring Parameters with the Increased Sensitivity to Residual or Irradiation Induced Inhomogeneities in Semiconductors." Semiconductor Physics Quantum Electronics & Optoelectronics 2009.
MLA-Zitierstil (8. Ausg.)Gaidar, G.P. "On Methodology of Measuring Parameters with the Increased Sensitivity to Residual or Irradiation Induced Inhomogeneities in Semiconductors." Semiconductor Physics Quantum Electronics & Optoelectronics, 2009.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.