APA (7th ed.) Citation

Gaidar, G. (2009). On methodology of measuring parameters with the increased sensitivity to residual or irradiation induced inhomogeneities in semiconductors. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Gaidar, G.P. "On Methodology of Measuring Parameters with the Increased Sensitivity to Residual or Irradiation Induced Inhomogeneities in Semiconductors." Semiconductor Physics Quantum Electronics & Optoelectronics 2009.

MLA (8th ed.) Citation

Gaidar, G.P. "On Methodology of Measuring Parameters with the Increased Sensitivity to Residual or Irradiation Induced Inhomogeneities in Semiconductors." Semiconductor Physics Quantum Electronics & Optoelectronics, 2009.

Warning: These citations may not always be 100% accurate.