Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector
. Bragg reflectors consisting of sequence of dielectric layers with a quarter wavelengths optical thickness are promising to create solar cells of third generation. SiОх /SiNx Bragg mirror (BM) at the backside of textured multicrystalline silicon solar cells was fabricated by PECVD method. BM wit...
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Datum: | 2009 |
| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2009
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/118845 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector / I.I. Ivanov, T.V. Nychyporuk, V.A. Skryshevsky, M. Lemiti // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 4. — С. 406-411. — Бібліогр.: 9 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
nasplib_isofts_kiev_ua-123456789-118845 |
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Ivanov, I.I. Nychyporuk, T.V. Skryshevsky, V.A. Lemiti, M. 2017-05-31T19:10:46Z 2017-05-31T19:10:46Z 2009 Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector / I.I. Ivanov, T.V. Nychyporuk, V.A. Skryshevsky, M. Lemiti // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 4. — С. 406-411. — Бібліогр.: 9 назв. — англ. 1560-8034 PACS 42.79.Bh, 78.66.Db, 84.60.Jt https://nasplib.isofts.kiev.ua/handle/123456789/118845 . Bragg reflectors consisting of sequence of dielectric layers with a quarter wavelengths optical thickness are promising to create solar cells of third generation. SiОх /SiNx Bragg mirror (BM) at the backside of textured multicrystalline silicon solar cells was fabricated by PECVD method. BM with 9 bi-layers was optimized for the maximum reflectivity within the wavelength range Δλ = 820...1110 nm. The maximum measured reflectivity is approximately 82 %. Measured reflectivity values were compared with the simulated ones by using the transfer matrix. Effect of parameters for pyramids of several types on the total reflectivity of BM deposited on textured silicon surface was simulated. Enhancement of light absorption and external quantum efficiency in the longwave part of the spectrum (λ > 940 nm) was observed, and it was explained as increase of the photon absorption length. The influence of BM on passivation of SC rear surface was explored. The cell back contact was formed by Al diffusion through BM to the μc-Si wafer and promoted by a pulsed laser. For SC with BM, the efficiency 13.75 % is obtained comparatively with efficiency 13.58 % for SC without BM. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector |
| spellingShingle |
Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector Ivanov, I.I. Nychyporuk, T.V. Skryshevsky, V.A. Lemiti, M. |
| title_short |
Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector |
| title_full |
Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector |
| title_fullStr |
Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector |
| title_full_unstemmed |
Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector |
| title_sort |
thin silicon solar cells with siох /sinx bragg mirror rear surface reflector |
| author |
Ivanov, I.I. Nychyporuk, T.V. Skryshevsky, V.A. Lemiti, M. |
| author_facet |
Ivanov, I.I. Nychyporuk, T.V. Skryshevsky, V.A. Lemiti, M. |
| publishDate |
2009 |
| language |
English |
| container_title |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| format |
Article |
| description |
. Bragg reflectors consisting of sequence of dielectric layers with a quarter
wavelengths optical thickness are promising to create solar cells of third generation.
SiОх /SiNx Bragg mirror (BM) at the backside of textured multicrystalline silicon solar
cells was fabricated by PECVD method. BM with 9 bi-layers was optimized for the
maximum reflectivity within the wavelength range Δλ = 820...1110 nm. The maximum
measured reflectivity is approximately 82 %. Measured reflectivity values were
compared with the simulated ones by using the transfer matrix. Effect of parameters for
pyramids of several types on the total reflectivity of BM deposited on textured silicon
surface was simulated. Enhancement of light absorption and external quantum efficiency
in the longwave part of the spectrum (λ > 940 nm) was observed, and it was explained as
increase of the photon absorption length. The influence of BM on passivation of SC rear
surface was explored. The cell back contact was formed by Al diffusion through BM to
the μc-Si wafer and promoted by a pulsed laser. For SC with BM, the efficiency 13.75 %
is obtained comparatively with efficiency 13.58 % for SC without BM.
|
| issn |
1560-8034 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/118845 |
| citation_txt |
Thin silicon solar cells with SiОх /SiNx Bragg mirror rear surface reflector / I.I. Ivanov, T.V. Nychyporuk, V.A. Skryshevsky, M. Lemiti // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 4. — С. 406-411. — Бібліогр.: 9 назв. — англ. |
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| first_indexed |
2025-12-07T13:35:41Z |
| last_indexed |
2025-12-07T13:35:41Z |
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