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The resolution function and effective response of piezoelectric thin films in Piezoresponse Force Microscopy

The elastic Green function and resolution function in Piezoresponse Force
 Microscopy (PFM) of thin piezoelectric film capped on the rigid substrate are derived.
 The extrinsic size effect on the resolution function is demonstrated.

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Bibliographic Details
Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2008
Main Author: Morozovska, A.N.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2008
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/118851
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:The resolution function and effective response of piezoelectric thin films in Piezoresponse Force Microscopy / A.N. Morozovska // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 2. — С. 171-177. — Бібліогр.: 11 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine

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