Research of Structural Quality of Big-Size KDP Crystals
The faulted structure formation at a rapid growing of big-size KDP crystals has been analyzed. A transitional zone with high degree of lattice faultness has been revealed between the seed and the pure zone of the grown crystal by X-ray diffraction methods with high resolution. It has been determi...
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Datum: | 2008 |
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2008
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/118853 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Research of Structural Quality of Big-Size KDP Crystals / V. I. Salo, V. F. Tkachenko, V.M. Puzikov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 2. — С. 132-135. — Бібліогр.: 7 назв. — англ. |
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Salo, V.I. Tkachenko, V.F. Puzikov, V.M. 2017-05-31T19:26:16Z 2017-05-31T19:26:16Z 2008 Research of Structural Quality of Big-Size KDP Crystals / V. I. Salo, V. F. Tkachenko, V.M. Puzikov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 2. — С. 132-135. — Бібліогр.: 7 назв. — англ. 1560-8034 PACS 61.10.-i https://nasplib.isofts.kiev.ua/handle/123456789/118853 The faulted structure formation at a rapid growing of big-size KDP crystals has been analyzed. A transitional zone with high degree of lattice faultness has been revealed between the seed and the pure zone of the grown crystal by X-ray diffraction methods with high resolution. It has been determined that, regardless of the seed form, the transitional layer in grown crystals reaches the value of~12 mm. The nonmonotone variation of the crystal lattice parameter (∆d/d) within ±2.5·10⁻⁵ and the halfwidth of a diffraction reflection curve (β = 5.5÷8 arcs for direction [103] and β = 7÷9 arcs for direction [100]) and the increase of the integral power of reflection of the X-ray beam IR by 1.5 times are observed in the transitional lay en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Research of Structural Quality of Big-Size KDP Crystals Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Research of Structural Quality of Big-Size KDP Crystals |
| spellingShingle |
Research of Structural Quality of Big-Size KDP Crystals Salo, V.I. Tkachenko, V.F. Puzikov, V.M. |
| title_short |
Research of Structural Quality of Big-Size KDP Crystals |
| title_full |
Research of Structural Quality of Big-Size KDP Crystals |
| title_fullStr |
Research of Structural Quality of Big-Size KDP Crystals |
| title_full_unstemmed |
Research of Structural Quality of Big-Size KDP Crystals |
| title_sort |
research of structural quality of big-size kdp crystals |
| author |
Salo, V.I. Tkachenko, V.F. Puzikov, V.M. |
| author_facet |
Salo, V.I. Tkachenko, V.F. Puzikov, V.M. |
| publishDate |
2008 |
| language |
English |
| container_title |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| format |
Article |
| description |
The faulted structure formation at a rapid growing of big-size KDP crystals has
been analyzed. A transitional zone with high degree of lattice faultness has been revealed
between the seed and the pure zone of the grown crystal by X-ray diffraction methods with
high resolution. It has been determined that, regardless of the seed form, the transitional layer
in grown crystals reaches the value of~12 mm. The nonmonotone variation of the crystal
lattice parameter (∆d/d) within ±2.5·10⁻⁵ and the halfwidth of a diffraction reflection curve
(β = 5.5÷8 arcs for direction [103] and β = 7÷9 arcs for direction [100]) and the increase of
the integral power of reflection of the X-ray beam IR
by 1.5 times are observed in the
transitional lay
|
| issn |
1560-8034 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/118853 |
| citation_txt |
Research of Structural Quality of Big-Size KDP Crystals / V. I. Salo, V. F. Tkachenko, V.M. Puzikov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 2. — С. 132-135. — Бібліогр.: 7 назв. — англ. |
| work_keys_str_mv |
AT salovi researchofstructuralqualityofbigsizekdpcrystals AT tkachenkovf researchofstructuralqualityofbigsizekdpcrystals AT puzikovvm researchofstructuralqualityofbigsizekdpcrystals |
| first_indexed |
2025-11-30T21:55:33Z |
| last_indexed |
2025-11-30T21:55:33Z |
| _version_ |
1850858589489463296 |