Research of Structural Quality of Big-Size KDP Crystals
The faulted structure formation at a rapid growing of big-size KDP crystals has been analyzed. A transitional zone with high degree of lattice faultness has been revealed between the seed and the pure zone of the grown crystal by X-ray diffraction methods with high resolution. It has been determi...
Gespeichert in:
| Datum: | 2008 |
|---|---|
| Hauptverfasser: | Salo, V.I., Tkachenko, V.F., Puzikov, V.M. |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2008
|
| Schriftenreihe: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/118853 |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Research of Structural Quality of Big-Size KDP Crystals / V. I. Salo, V. F. Tkachenko, V.M. Puzikov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 2. — С. 132-135. — Бібліогр.: 7 назв. — англ. |
Institution
Digital Library of Periodicals of National Academy of Sciences of UkraineÄhnliche Einträge
-
Effect of growth conditions on structure quality of KDP crystals
von: Salo, V.I., et al.
Veröffentlicht: (2000) -
Structure perfection of large-size KDP crystals grown by various techniques
von: Puzikov, V.M., et al.
Veröffentlicht: (2008) -
Growing of thallium-doped KDP and ADP crystals: structural and optical parameters
von: Salo, V.I., et al.
Veröffentlicht: (2005) -
Study of structure perfection of KDP single crystals using the X-ray dynamic diffraction effects
von: Puzikov, V.M., et al.
Veröffentlicht: (2011) -
XRD method for the determination of internal stresses in KDP crystals and their relationship to the anomalous biaxiality
von: Puzikov, V.M., et al.
Veröffentlicht: (2015)