Direct current transport mechanisms in n-InSe/p-CdTe heterostructure

The authors created n-InSe/p-CdTe heterojunction by deposition over optical contact, investigated temperature evolution of its current-voltage dependences under the forward bias, and determined the prevailing current transport mechanisms in the structure. It was shown that misfit dislocations at...

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Збережено в:
Бібліографічні деталі
Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:2008
Автори: Gorley, P.M., Prokopenko, I.V., Grushka, Z.M., Makhniy, V.P., Grushka, O.G., Chervinsky, O.A.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2008
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/118856
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Direct current transport mechanisms in n-InSe/p-CdTe heterostructure / P.M. Gorley, I.V. Prokopenko, Z.M. Grushka, V.P. Makhniy, O.G. Grushka, O.A. Chervinsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 2. — С. 124-131. — Бібліогр.: 34 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-118856
record_format dspace
spelling Gorley, P.M.
Prokopenko, I.V.
Grushka, Z.M.
Makhniy, V.P.
Grushka, O.G.
Chervinsky, O.A.
2017-05-31T19:29:18Z
2017-05-31T19:29:18Z
2008
Direct current transport mechanisms in n-InSe/p-CdTe heterostructure / P.M. Gorley, I.V. Prokopenko, Z.M. Grushka, V.P. Makhniy, O.G. Grushka, O.A. Chervinsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 2. — С. 124-131. — Бібліогр.: 34 назв. — англ.
1560-8034
PACS 73.40.Cg, Gk, Lq
https://nasplib.isofts.kiev.ua/handle/123456789/118856
The authors created n-InSe/p-CdTe heterojunction by deposition over optical contact, investigated temperature evolution of its current-voltage dependences under the forward bias, and determined the prevailing current transport mechanisms in the structure. It was shown that misfit dislocations at the boundary between the semiconductors form a stable periodic structure acting as slow recombination centers for the carriers. The properties of the material suggest promising application perspectives for n-InSe/p-CdTe heterojunction, especially for the devices working at high temperatures and elevated radiation.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Direct current transport mechanisms in n-InSe/p-CdTe heterostructure
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Direct current transport mechanisms in n-InSe/p-CdTe heterostructure
spellingShingle Direct current transport mechanisms in n-InSe/p-CdTe heterostructure
Gorley, P.M.
Prokopenko, I.V.
Grushka, Z.M.
Makhniy, V.P.
Grushka, O.G.
Chervinsky, O.A.
title_short Direct current transport mechanisms in n-InSe/p-CdTe heterostructure
title_full Direct current transport mechanisms in n-InSe/p-CdTe heterostructure
title_fullStr Direct current transport mechanisms in n-InSe/p-CdTe heterostructure
title_full_unstemmed Direct current transport mechanisms in n-InSe/p-CdTe heterostructure
title_sort direct current transport mechanisms in n-inse/p-cdte heterostructure
author Gorley, P.M.
Prokopenko, I.V.
Grushka, Z.M.
Makhniy, V.P.
Grushka, O.G.
Chervinsky, O.A.
author_facet Gorley, P.M.
Prokopenko, I.V.
Grushka, Z.M.
Makhniy, V.P.
Grushka, O.G.
Chervinsky, O.A.
publishDate 2008
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description The authors created n-InSe/p-CdTe heterojunction by deposition over optical contact, investigated temperature evolution of its current-voltage dependences under the forward bias, and determined the prevailing current transport mechanisms in the structure. It was shown that misfit dislocations at the boundary between the semiconductors form a stable periodic structure acting as slow recombination centers for the carriers. The properties of the material suggest promising application perspectives for n-InSe/p-CdTe heterojunction, especially for the devices working at high temperatures and elevated radiation.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/118856
citation_txt Direct current transport mechanisms in n-InSe/p-CdTe heterostructure / P.M. Gorley, I.V. Prokopenko, Z.M. Grushka, V.P. Makhniy, O.G. Grushka, O.A. Chervinsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 2. — С. 124-131. — Бібліогр.: 34 назв. — англ.
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AT grushkazm directcurrenttransportmechanismsinninsepcdteheterostructure
AT makhniyvp directcurrenttransportmechanismsinninsepcdteheterostructure
AT grushkaog directcurrenttransportmechanismsinninsepcdteheterostructure
AT chervinskyoa directcurrenttransportmechanismsinninsepcdteheterostructure
first_indexed 2025-12-07T19:29:22Z
last_indexed 2025-12-07T19:29:22Z
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