Effect of the structure of polarimeter characteristic matrix on light polarization measurements

• Veröffentlicht in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Datum: 2009
• Hauptverfasser: Savenkov, S.N., Oberemok, Ye.A., Klimov, O.S., Barchuk, О.I.
• Format: Artikel
• Sprache: Englisch
• Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2009
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/118872
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: Effect of the structure of polarimeter characteristic matrix
 on light polarization measurements / S.N. Savenkov, Ye.A. Oberemok, O.S. Klimov, О.I. Barchuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2009. — Т. 12, № 3. — С.264-271. — Бібліогр.: 26 назв. — англ.

In the paper, we carried out the comparative analysis of three polarimeters
 among the most usable their variants: (i) Stokes polarimeter based on phenomenological
 definition of Stokes parameters; (ii) Stokes polarimeter based on the method of four
 intensities; (iii) Stokes...