Effect of the state of the surface layers on the strength of materials for optoelectronic and sensors devices
The goal of this work is to determine the correlation of the strength of brittle amorphous nonmetallic materials with the defective surface layers and their physical properties. The defective surface layer of materials for optoelectronic and sensors devices consists of abundant structural near-su...
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Datum: | 2008 |
| 1. Verfasser: | |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2008
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/119047 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Effect of the state of the surface layers on the strength of materials for optoelectronic and sensors devices / V.P. Maslov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 3. — С. 286-291. — Бібліогр.: 19 назв. — англ. |