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Effect of the state of the surface layers on the strength of materials for optoelectronic and sensors devices

The goal of this work is to determine the correlation of the strength of brittle
 amorphous nonmetallic materials with the defective surface layers and their physical
 properties. The defective surface layer of materials for optoelectronic and sensors devices
 consists of abu...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2008
ISSN:1560-8034
1. Verfasser: Maslov, V.P.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2008
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/119047
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Effect of the state of the surface layers on the strength of materials for optoelectronic and sensors devices / V.P. Maslov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 3. — С. 286-291. — Бібліогр.: 19 назв. — англ.

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