Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure

• Published in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Date: 2008
• ISSN: 1560-8034
• Main Authors: Kurbatov, D., Opanasyuk, A., Denisenko, V., Kramchenkov, A., Zaharets, M.
• Format: Article
• Language: English
• Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2008
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/119059
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure / D. Kurbatov, A. Opanasyuk, V. Denisenko, A. Kramchenkov, M. Zaharets // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 3. — С. 252-256. — Бібліогр.: 14 назв. — англ.

The surface morphology and chemical composition of Ag/ZnS/glassceramic
 thin-film system obtained by close-spaced vacuum sublimation technique under different
 grow conditions were investigated. Examination of surface profile and morphology was
 performed by scanning electron and optical microscopy. Chemical composition was
 studied by Rutherford back scattering method. Results of morphology studies enabled to
 determine dependence of the growth mechanism, roughness Ra, grain size D of ZnS
 layers on the growth conditions. The researches of chemical composition allowed to
 determine the concentration of compound elements and impurities, deviation from
 stoichiometry and thickness distribution of chemical elements.