Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure
The surface morphology and chemical composition of Ag/ZnS/glassceramic
 thin-film system obtained by close-spaced vacuum sublimation technique under different
 grow conditions were investigated. Examination of surface profile and morphology was
 performed by scanning electron...
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Datum: | 2008 |
| Hauptverfasser: | , , , , |
| Format: | Artikel |
| Sprache: | Englisch |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2008
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/119059 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure / D. Kurbatov, A. Opanasyuk, V. Denisenko, A. Kramchenkov, M. Zaharets // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 3. — С. 252-256. — Бібліогр.: 14 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862580760472453120 |
|---|---|
| author | Kurbatov, D. Opanasyuk, A. Denisenko, V. Kramchenkov, A. Zaharets, M. |
| author_facet | Kurbatov, D. Opanasyuk, A. Denisenko, V. Kramchenkov, A. Zaharets, M. |
| citation_txt | Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure / D. Kurbatov, A. Opanasyuk, V. Denisenko, A. Kramchenkov, M. Zaharets // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 3. — С. 252-256. — Бібліогр.: 14 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | The surface morphology and chemical composition of Ag/ZnS/glassceramic
thin-film system obtained by close-spaced vacuum sublimation technique under different
grow conditions were investigated. Examination of surface profile and morphology was
performed by scanning electron and optical microscopy. Chemical composition was
studied by Rutherford back scattering method. Results of morphology studies enabled to
determine dependence of the growth mechanism, roughness Ra, grain size D of ZnS
layers on the growth conditions. The researches of chemical composition allowed to
determine the concentration of compound elements and impurities, deviation from
stoichiometry and thickness distribution of chemical elements.
|
| first_indexed | 2025-11-26T21:25:40Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-119059 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-11-26T21:25:40Z |
| publishDate | 2008 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Kurbatov, D. Opanasyuk, A. Denisenko, V. Kramchenkov, A. Zaharets, M. 2017-06-03T04:51:12Z 2017-06-03T04:51:12Z 2008 Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure / D. Kurbatov, A. Opanasyuk, V. Denisenko, A. Kramchenkov, M. Zaharets // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 3. — С. 252-256. — Бібліогр.: 14 назв. — англ. 1560-8034 PACS 68.35.Ct, 68.55.J, 68.55.Nq https://nasplib.isofts.kiev.ua/handle/123456789/119059 The surface morphology and chemical composition of Ag/ZnS/glassceramic
 thin-film system obtained by close-spaced vacuum sublimation technique under different
 grow conditions were investigated. Examination of surface profile and morphology was
 performed by scanning electron and optical microscopy. Chemical composition was
 studied by Rutherford back scattering method. Results of morphology studies enabled to
 determine dependence of the growth mechanism, roughness Ra, grain size D of ZnS
 layers on the growth conditions. The researches of chemical composition allowed to
 determine the concentration of compound elements and impurities, deviation from
 stoichiometry and thickness distribution of chemical elements. The authors would like to thank Ph.D. V. Laptev from
 Institute of Physical Electronics (University of Stuttgart)
 for optical investigations of film surfaces. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure Article published earlier |
| spellingShingle | Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure Kurbatov, D. Opanasyuk, A. Denisenko, V. Kramchenkov, A. Zaharets, M. |
| title | Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure |
| title_full | Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure |
| title_fullStr | Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure |
| title_full_unstemmed | Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure |
| title_short | Investigations of surface morphology and chemical composition of Ag/ZnS/glassceramic thin-film structure |
| title_sort | investigations of surface morphology and chemical composition of ag/zns/glassceramic thin-film structure |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/119059 |
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