APA (7th ed.) Citation

Rengevych, O., Shirshov, Y., Ushenin, Y., & Beketov, A. (1999). Separate determination of thickness and optical parameters by surface plasmon resonance: Accuracy consideration. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Rengevych, O.V, Yu.M Shirshov, Yu.V Ushenin, and A.G Beketov. "Separate Determination of Thickness and Optical Parameters by Surface Plasmon Resonance: Accuracy Consideration." Semiconductor Physics Quantum Electronics & Optoelectronics 1999.

MLA (8th ed.) Citation

Rengevych, O.V, et al. "Separate Determination of Thickness and Optical Parameters by Surface Plasmon Resonance: Accuracy Consideration." Semiconductor Physics Quantum Electronics & Optoelectronics, 1999.

Warning: These citations may not always be 100% accurate.