Mathematic modeling the oxygen distribution mechanism in Si ingots during growing processes

The article provides specified mathematic modeling of oxygen distribution mechanism in Si ingots. Experimentally such model parameters as quartz melting speed for different melting zones, initial oxygen concentration in melt, influence of crucible rotation speed on melting rate. The work outlines th...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2004
Hauptverfasser: Oksanich, A.P., Pritchin, S.E., Vasheruk, A.V.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2004
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/119116
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Mathematic modeling the oxygen distribution mechanism in Si ingots during growing processes / A.P. Oksanich, S.E. Pritchin, A.V. Vasheruk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 3. — С. 236-239. — Бібліогр.: 8 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-119116
record_format dspace
spelling Oksanich, A.P.
Pritchin, S.E.
Vasheruk, A.V.
2017-06-04T15:51:17Z
2017-06-04T15:51:17Z
2004
Mathematic modeling the oxygen distribution mechanism in Si ingots during growing processes / A.P. Oksanich, S.E. Pritchin, A.V. Vasheruk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 3. — С. 236-239. — Бібліогр.: 8 назв. — англ.
1560-8034
PACS: 42.65; 42.70; 61.70
https://nasplib.isofts.kiev.ua/handle/123456789/119116
The article provides specified mathematic modeling of oxygen distribution mechanism in Si ingots. Experimentally such model parameters as quartz melting speed for different melting zones, initial oxygen concentration in melt, influence of crucible rotation speed on melting rate. The work outlines the results of computer modeling. The results of theoretical and experimental investigations carried make possible to predict oxygen concentration in Si ingot and define the technology parameters for growing ingots of stated concentration.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Mathematic modeling the oxygen distribution mechanism in Si ingots during growing processes
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Mathematic modeling the oxygen distribution mechanism in Si ingots during growing processes
spellingShingle Mathematic modeling the oxygen distribution mechanism in Si ingots during growing processes
Oksanich, A.P.
Pritchin, S.E.
Vasheruk, A.V.
title_short Mathematic modeling the oxygen distribution mechanism in Si ingots during growing processes
title_full Mathematic modeling the oxygen distribution mechanism in Si ingots during growing processes
title_fullStr Mathematic modeling the oxygen distribution mechanism in Si ingots during growing processes
title_full_unstemmed Mathematic modeling the oxygen distribution mechanism in Si ingots during growing processes
title_sort mathematic modeling the oxygen distribution mechanism in si ingots during growing processes
author Oksanich, A.P.
Pritchin, S.E.
Vasheruk, A.V.
author_facet Oksanich, A.P.
Pritchin, S.E.
Vasheruk, A.V.
publishDate 2004
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description The article provides specified mathematic modeling of oxygen distribution mechanism in Si ingots. Experimentally such model parameters as quartz melting speed for different melting zones, initial oxygen concentration in melt, influence of crucible rotation speed on melting rate. The work outlines the results of computer modeling. The results of theoretical and experimental investigations carried make possible to predict oxygen concentration in Si ingot and define the technology parameters for growing ingots of stated concentration.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/119116
citation_txt Mathematic modeling the oxygen distribution mechanism in Si ingots during growing processes / A.P. Oksanich, S.E. Pritchin, A.V. Vasheruk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 3. — С. 236-239. — Бібліогр.: 8 назв. — англ.
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first_indexed 2025-11-30T16:57:01Z
last_indexed 2025-11-30T16:57:01Z
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