Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films

The electroreflectance method based on the electrolyte technique is used for investigation of electron transitions E₀, E₀ + Δ₀ in homoepitaxial films n-GaP (111) with the electron concentration 5.7*10²³ m⁻³ before and after irradiation by ⁶⁰Co gamma quanta in the dose range 10⁵ – 10⁶ rad under the r...

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Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:2004
Автори: Gentsar, P.A., Kudryavtsev, A.A.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2004
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/119117
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films / P.A. Gentsar, A.A. Kudryavtsev // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 3. — С. 240-242. — Бібліогр.: 7 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-119117
record_format dspace
spelling Gentsar, P.A.
Kudryavtsev, A.A.
2017-06-04T15:52:49Z
2017-06-04T15:52:49Z
2004
Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films / P.A. Gentsar, A.A. Kudryavtsev // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 3. — С. 240-242. — Бібліогр.: 7 назв. — англ.
1560-8034
PACS: 73.20; 78.66
https://nasplib.isofts.kiev.ua/handle/123456789/119117
The electroreflectance method based on the electrolyte technique is used for investigation of electron transitions E₀, E₀ + Δ₀ in homoepitaxial films n-GaP (111) with the electron concentration 5.7*10²³ m⁻³ before and after irradiation by ⁶⁰Co gamma quanta in the dose range 10⁵ – 10⁶ rad under the room temperature. The authors observed splitting the low-energy extremum after irradiation. The decrease in internal mechanical strains inside the films as a result of gamma irradiation was estimated via changes of the electron transition energy and collision parameter of widening. Also estimated is the time of charge carrier energy relaxation after irradiation.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films
spellingShingle Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films
Gentsar, P.A.
Kudryavtsev, A.A.
title_short Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films
title_full Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films
title_fullStr Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films
title_full_unstemmed Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films
title_sort radiation-stimulated relaxation of internal mechanical straines in homoepitaxial gap films
author Gentsar, P.A.
Kudryavtsev, A.A.
author_facet Gentsar, P.A.
Kudryavtsev, A.A.
publishDate 2004
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description The electroreflectance method based on the electrolyte technique is used for investigation of electron transitions E₀, E₀ + Δ₀ in homoepitaxial films n-GaP (111) with the electron concentration 5.7*10²³ m⁻³ before and after irradiation by ⁶⁰Co gamma quanta in the dose range 10⁵ – 10⁶ rad under the room temperature. The authors observed splitting the low-energy extremum after irradiation. The decrease in internal mechanical strains inside the films as a result of gamma irradiation was estimated via changes of the electron transition energy and collision parameter of widening. Also estimated is the time of charge carrier energy relaxation after irradiation.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/119117
citation_txt Radiation-stimulated relaxation of internal mechanical straines in homoepitaxial GaP films / P.A. Gentsar, A.A. Kudryavtsev // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 3. — С. 240-242. — Бібліогр.: 7 назв. — англ.
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first_indexed 2025-12-07T19:57:16Z
last_indexed 2025-12-07T19:57:16Z
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