Optical properties of dielectric layers with CeO₂
The polycrystalline thin films CeO₂, WO₃, amorphous complex films WO₃ + CeO₂ with content of CeO₂ in the powder 10, 15 and 20 %, and CeO₂ + Dy₂O₃ with content of Dy₂O3 in the powder 10, 15 and 20 % are obtained by vacuum deposition method via powder evaporation. For the first time the optical charac...
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Datum: | 2004 |
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| Format: | Artikel |
| Sprache: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2004
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/119127 |
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| Zitieren: | Optical properties of dielectric layers with CeO₂ / T.V. Semikina // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 3. — С. 291-296. — Бібліогр.: 18 назв. — англ. |
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Semikina, T.V. 2017-06-04T16:24:24Z 2017-06-04T16:24:24Z 2004 Optical properties of dielectric layers with CeO₂ / T.V. Semikina // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 3. — С. 291-296. — Бібліогр.: 18 назв. — англ. 1560-8034 PACS: 77.55.+f, 78.66.-w https://nasplib.isofts.kiev.ua/handle/123456789/119127 The polycrystalline thin films CeO₂, WO₃, amorphous complex films WO₃ + CeO₂ with content of CeO₂ in the powder 10, 15 and 20 %, and CeO₂ + Dy₂O₃ with content of Dy₂O3 in the powder 10, 15 and 20 % are obtained by vacuum deposition method via powder evaporation. For the first time the optical characteristics of complex films WO₃ + CeO₂ and CeO₂+Dy₂O₃ are obtained. As a results of films investigation by ellipsometry the dependencies of refraction and extinction coefficients on incident beam energy are presented. The dielectric permittivity and energy band gapes are calculated. The refraction coefficients of films CeO₂ are 1.85–2.85 and are not more than 2.37 for complex films. Dielectric constant e of complex films are 3.57–4.16, and e =4.7 of CeO₂ film. The CeO₂, WO₃, and WO₃ + CeO₂ films have wide band gape Eg = 2.8–3.37 eV. The author thanks A.N. Shmyryeva (NTUU "KPI") for the given samples and long time heading the authores work, V.G. Litovchenko for the consultation under results processing, Marion Friedrich and D.R.T. Zahn for the possibility to work in their laboratory of semiconductor physics in TU-Chemnitz, Germany. This work was financially supported by the grant from Ministry of Education of Saxon, Germany. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Optical properties of dielectric layers with CeO₂ Article published earlier |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Optical properties of dielectric layers with CeO₂ |
| spellingShingle |
Optical properties of dielectric layers with CeO₂ Semikina, T.V. |
| title_short |
Optical properties of dielectric layers with CeO₂ |
| title_full |
Optical properties of dielectric layers with CeO₂ |
| title_fullStr |
Optical properties of dielectric layers with CeO₂ |
| title_full_unstemmed |
Optical properties of dielectric layers with CeO₂ |
| title_sort |
optical properties of dielectric layers with ceo₂ |
| author |
Semikina, T.V. |
| author_facet |
Semikina, T.V. |
| publishDate |
2004 |
| language |
English |
| container_title |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| format |
Article |
| description |
The polycrystalline thin films CeO₂, WO₃, amorphous complex films WO₃ + CeO₂ with content of CeO₂ in the powder 10, 15 and 20 %, and CeO₂ + Dy₂O₃ with content of Dy₂O3 in the powder 10, 15 and 20 % are obtained by vacuum deposition method via powder evaporation. For the first time the optical characteristics of complex films WO₃ + CeO₂ and CeO₂+Dy₂O₃ are obtained. As a results of films investigation by ellipsometry the dependencies of refraction and extinction coefficients on incident beam energy are presented. The dielectric permittivity and energy band gapes are calculated. The refraction coefficients of films CeO₂ are 1.85–2.85 and are not more than 2.37 for complex films. Dielectric constant e of complex films are 3.57–4.16, and e =4.7 of CeO₂ film. The CeO₂, WO₃, and WO₃ + CeO₂ films have wide band gape Eg = 2.8–3.37 eV.
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| issn |
1560-8034 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/119127 |
| fulltext |
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| citation_txt |
Optical properties of dielectric layers with CeO₂ / T.V. Semikina // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 3. — С. 291-296. — Бібліогр.: 18 назв. — англ. |
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AT semikinatv opticalpropertiesofdielectriclayerswithceo2 |
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2025-11-24T10:14:37Z |
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2025-11-24T10:14:37Z |
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1850844667373944832 |