Structural dependence of CsI(Tl) film scintillation properties
Scintillating CsI(Tl) films were obtained by vacuum deposition on single crystalline LiF substrates and non-orienting glass substrates. Their structure and morphology were examined by X-ray diffraction and scanning electron microscopy. Scintillation properties of films dependent on their structure a...
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| Published in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Date: | 2004 |
| Main Authors: | Ananenko, A., Fedorov, A., Lebedinsky, A., Mateychenko, P., Tarasov, V., Vidaj, Yu. |
| Format: | Article |
| Language: | English |
| Published: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2004
|
| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/119128 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Structural dependence of CsI(Tl) film scintillation properties / A. Ananenko, A. Fedorov, A. Lebedinsky, P. Mateychenko, V. Tarasov, Yu. Vidaj // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 3. — С. 297-300. — Бібліогр.: 5 назв. — англ. |
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