Lysenko, V., Tyagulski, I., Gomeniuk, Y., & Osiyuk, I. (2001). Effect of oxide-semiconductor interface traps on low-temperature operation of MOSFETs. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago-Zitierstil (17. Ausg.)Lysenko, V.S, I.P Tyagulski, Y.V Gomeniuk, und I.N Osiyuk. "Effect of Oxide-semiconductor Interface Traps on Low-temperature Operation of MOSFETs." Semiconductor Physics Quantum Electronics & Optoelectronics 2001.
MLA-Zitierstil (8. Ausg.)Lysenko, V.S, et al. "Effect of Oxide-semiconductor Interface Traps on Low-temperature Operation of MOSFETs." Semiconductor Physics Quantum Electronics & Optoelectronics, 2001.
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