APA (7th ed.) Citation

Lysenko, V., Tyagulski, I., Gomeniuk, Y., & Osiyuk, I. (2001). Effect of oxide-semiconductor interface traps on low-temperature operation of MOSFETs. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Lysenko, V.S, I.P Tyagulski, Y.V Gomeniuk, and I.N Osiyuk. "Effect of Oxide-semiconductor Interface Traps on Low-temperature Operation of MOSFETs." Semiconductor Physics Quantum Electronics & Optoelectronics 2001.

MLA (8th ed.) Citation

Lysenko, V.S, et al. "Effect of Oxide-semiconductor Interface Traps on Low-temperature Operation of MOSFETs." Semiconductor Physics Quantum Electronics & Optoelectronics, 2001.

Warning: These citations may not always be 100% accurate.