Datsenko, L., Klad’ko, V., Lytvyn, P., Domagala, J., Machulin, V., Prokopenko, I., . . . Maksimenko, Z. (2001). Complex diffractometrical investigation of structural and compositional irregularities in GaAs: Si/GaAs films heavily doped with silicon. Semiconductor Physics Quantum Electronics & Optoelectronics.
Чикаго стиль цитування (17-те видання)Datsenko, L.I, V.P Klad’ko, P.M Lytvyn, J. Domagala, V.F Machulin, I.V Prokopenko, V.B Molodkin, та Z.V Maksimenko. "Complex Diffractometrical Investigation of Structural and Compositional Irregularities in GaAs: Si/GaAs Films Heavily Doped with Silicon." Semiconductor Physics Quantum Electronics & Optoelectronics 2001.
Стиль цитування MLA (8-ме видання)Datsenko, L.I, et al. "Complex Diffractometrical Investigation of Structural and Compositional Irregularities in GaAs: Si/GaAs Films Heavily Doped with Silicon." Semiconductor Physics Quantum Electronics & Optoelectronics, 2001.