APA (7th ed.) Citation

Datsenko, L., Klad’ko, V., Lytvyn, P., Domagala, J., Machulin, V., Prokopenko, I., . . . Maksimenko, Z. (2001). Complex diffractometrical investigation of structural and compositional irregularities in GaAs: Si/GaAs films heavily doped with silicon. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Datsenko, L.I, V.P Klad’ko, P.M Lytvyn, J. Domagala, V.F Machulin, I.V Prokopenko, V.B Molodkin, and Z.V Maksimenko. "Complex Diffractometrical Investigation of Structural and Compositional Irregularities in GaAs: Si/GaAs Films Heavily Doped with Silicon." Semiconductor Physics Quantum Electronics & Optoelectronics 2001.

MLA (8th ed.) Citation

Datsenko, L.I, et al. "Complex Diffractometrical Investigation of Structural and Compositional Irregularities in GaAs: Si/GaAs Films Heavily Doped with Silicon." Semiconductor Physics Quantum Electronics & Optoelectronics, 2001.

Warning: These citations may not always be 100% accurate.