Refractory contact to a-SiC produced by laser technology methods
Developed in the paper are method and technological scheme to obtain ohmic contacts (OC) to a-SiC(:N), Nd - Na ~1 - 3.10¹⁸ cm⁻³ by pulse laser deposition (PLD) of multilayer structures Ni/W/Si₃N₄/W and the following laser annealing (LA). When using an YAG:Nd³⁺ laser, threshold levels and optimal reg...
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| Published in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Date: | 2001 |
| Main Authors: | Fedorenko, L.L., Kiseleov, V.S., Svechnikov, S.V., Yusupov, M.M., Beketov, G.V. |
| Format: | Article |
| Language: | English |
| Published: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2001
|
| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/119279 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Refractory contact to a-SiC produced by laser technology methods / L.L. Fedorenko, V.S. Kiseleov, S.V. Svechnikov, M.M. Yusupov, G.V. Beketov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 3. — С. 192-195. — Бібліогр.: 8 назв. — англ. |
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