Descartes-Snell law of refraction with absorption
The state of the art in the theory of optical constants of matter is considered for different spectral ranges of light absorption. It is stressed that up to now no there exists no commonly accepted formula for calculation of refractive index in the X-ray region. Starting from three different approac...
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| Published in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Date: | 2001 |
| Main Author: | |
| Format: | Article |
| Language: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2001
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| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/119280 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Descartes-Snell law of refraction with absorption / S.A. Kovalenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 3. — С. 214-218. — Бібліогр.: 18 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862540759837704192 |
|---|---|
| author | Kovalenko, S.A. |
| author_facet | Kovalenko, S.A. |
| citation_txt | Descartes-Snell law of refraction with absorption / S.A. Kovalenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 3. — С. 214-218. — Бібліогр.: 18 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | The state of the art in the theory of optical constants of matter is considered for different spectral ranges of light absorption. It is stressed that up to now no there exists no commonly accepted formula for calculation of refractive index in the X-ray region. Starting from three different approaches, an analysis is made of relations between the angles of refraction and incidence in the case of a transparent medium-absorbing medium interface. Through analysis of the corresponding plots each of relations is estimated from the standpoint of possibility for its practical application. A novel version of the Descartes-Snell law is advanced. For the first time an expression (15) is obtained that is completely substantiated, both mathematically and physically. It may be recommended for use, first of all, when calculating multiplayer coatings in the X-ray optics units. It is stated that further investigations in this area are required, especially when performing experiments for different regions of optical and X-ray spectra.
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| first_indexed | 2025-11-24T16:06:33Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-119280 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-11-24T16:06:33Z |
| publishDate | 2001 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Kovalenko, S.A. 2017-06-05T17:41:42Z 2017-06-05T17:41:42Z 2001 Descartes-Snell law of refraction with absorption / S.A. Kovalenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 3. — С. 214-218. — Бібліогр.: 18 назв. — англ. 1560-8034 PACS: 78.20.C https://nasplib.isofts.kiev.ua/handle/123456789/119280 The state of the art in the theory of optical constants of matter is considered for different spectral ranges of light absorption. It is stressed that up to now no there exists no commonly accepted formula for calculation of refractive index in the X-ray region. Starting from three different approaches, an analysis is made of relations between the angles of refraction and incidence in the case of a transparent medium-absorbing medium interface. Through analysis of the corresponding plots each of relations is estimated from the standpoint of possibility for its practical application. A novel version of the Descartes-Snell law is advanced. For the first time an expression (15) is obtained that is completely substantiated, both mathematically and physically. It may be recommended for use, first of all, when calculating multiplayer coatings in the X-ray optics units. It is stated that further investigations in this area are required, especially when performing experiments for different regions of optical and X-ray spectra. The author is grateful to М.Р. Lisitsa and G.G. Tarasov for fruitful discussions and help in work. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Descartes-Snell law of refraction with absorption Article published earlier |
| spellingShingle | Descartes-Snell law of refraction with absorption Kovalenko, S.A. |
| title | Descartes-Snell law of refraction with absorption |
| title_full | Descartes-Snell law of refraction with absorption |
| title_fullStr | Descartes-Snell law of refraction with absorption |
| title_full_unstemmed | Descartes-Snell law of refraction with absorption |
| title_short | Descartes-Snell law of refraction with absorption |
| title_sort | descartes-snell law of refraction with absorption |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/119280 |
| work_keys_str_mv | AT kovalenkosa descartessnelllawofrefractionwithabsorption |