Singular peculiarities of a plane wave diffracted on half-plane

• Опубліковано в: : Semiconductor Physics Quantum Electronics & Optoelectronics
• Дата: 2001
• Автори: Anokhov, S., Khizhnyak, A., Lymarenko, R., Soskin, M.
• Формат: Стаття
• Мова: Англійська
• Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2001
• Онлайн доступ: https://nasplib.isofts.kiev.ua/handle/123456789/119284
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: Singular peculiarities of a plane wave diffracted on half-plane / S. Anokhov, A. Khizhnyak, R. Lymarenko, M. Soskin // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 3. — С. 239-247. — Бібліогр.: 11 назв. — англ.

We analyzed singular properties of edge dislocation waves («EDW») - the main information component of the field formed at plane wave diffraction on half-plane. It is shown that analytical structure of this wave is completely identical to Cornu’s spiral, while physical simulation thereof requires joining the plane wave with an edge dislocation. Dislocations of this type are rather sensitive to action of any amplitude phase distortion on them that considering the impact of actual noise essentially hampers their experimental isolation in the pure form. At the same time spatial position of such dislocation may be effectively controlled by changing the amplitude and phase of one of the wave components. We considered peculiarities of structural evolution of the field at more complicated form of diffraction aperture.