Influence of solution precursors on structure of ZnO films

In the work using high resolution scanning electron microscopy and X-ray analysis, we carry out the studying of the correlation between chemical and technological conditions of deposition, the initial solution composition and structural properties of the synthesized samples of zinc oxide. Growth of...

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Bibliographic Details
Published in:Functional Materials
Date:2015
Main Authors: Berestok, T.O., Kurbatov, D.I., Opanasyuk, N.M., Opanasyuk, A.S.
Format: Article
Language:English
Published: НТК «Інститут монокристалів» НАН України 2015
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Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/119303
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Influence of solution precursors on structure of ZnO films / T.O. Berestok, D.I. Kurbatov, N.M. Opanasyuk, A.S. Opanasyuk // Functional Materials. — 2015. — Т. 22, № 1. — С. 93-99. — Бібліогр.: 25 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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Summary:In the work using high resolution scanning electron microscopy and X-ray analysis, we carry out the studying of the correlation between chemical and technological conditions of deposition, the initial solution composition and structural properties of the synthesized samples of zinc oxide. Growth of the layers depends on the initial precursors and it occurs through formation of the ordered array of nanorods and nanoflowers. It is shown that it is possible to choose the optimal conditions to obtain ZnO films with controlled structural properties that can be used as the base layers in microelectronic devices.
ISSN:1027-5495