Kovalenko, S., & Lisitsa, M. (2001). Thickness dependences of optical constants for thin layers of some metals and semiconductors. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago-Zitierstil (17. Ausg.)Kovalenko, S.A, und M.P Lisitsa. "Thickness Dependences of Optical Constants for Thin Layers of Some Metals and Semiconductors." Semiconductor Physics Quantum Electronics & Optoelectronics 2001.
MLA-Zitierstil (8. Ausg.)Kovalenko, S.A, und M.P Lisitsa. "Thickness Dependences of Optical Constants for Thin Layers of Some Metals and Semiconductors." Semiconductor Physics Quantum Electronics & Optoelectronics, 2001.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.