Thickness dependences of optical constants for thin layers of some metals and semiconductors
The review comprises investigations devoted to determination of refractive index and absorption coefficient dependences on thickness for thin films of metals and atomic semiconductors.
 It has been shown that erroneous results were obtained in many papers and correct interpretation of the la...
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| Опубліковано в: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Дата: | 2001 |
| ISSN: | 1560-8034 |
| Автори: | , |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2001
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| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/119328 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Thickness dependences of optical constants for thin layers of some metals and semiconductors / S.A. Kovalenko, M.P. Lisitsa // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 4. — С. 352-357. — Бібліогр.: 13 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862750534013812736 |
|---|---|
| author | Kovalenko, S.A. Lisitsa, M.P. |
| author_facet | Kovalenko, S.A. Lisitsa, M.P. |
| citation_txt | Thickness dependences of optical constants for thin layers of some metals and semiconductors / S.A. Kovalenko, M.P. Lisitsa // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 4. — С. 352-357. — Бібліогр.: 13 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | The review comprises investigations devoted to determination of refractive index and absorption coefficient dependences on thickness for thin films of metals and atomic semiconductors.
It has been shown that erroneous results were obtained in many papers and correct interpretation of the latter is absent. The reason that braked the solution of the problem of dimensional optical phenomena in thin layer physics was ascertained.
|
| first_indexed | 2025-12-07T21:06:20Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-119328 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-12-07T21:06:20Z |
| publishDate | 2001 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Kovalenko, S.A. Lisitsa, M.P. 2017-06-06T12:58:28Z 2017-06-06T12:58:28Z 2001 Thickness dependences of optical constants for thin layers of some metals and semiconductors / S.A. Kovalenko, M.P. Lisitsa // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 4. — С. 352-357. — Бібліогр.: 13 назв. — англ. 1560-8034 PACS: 78.66 https://nasplib.isofts.kiev.ua/handle/123456789/119328 The review comprises investigations devoted to determination of refractive index and absorption coefficient dependences on thickness for thin films of metals and atomic semiconductors.
 It has been shown that erroneous results were obtained in many papers and correct interpretation of the latter is absent. The reason that braked the solution of the problem of dimensional optical phenomena in thin layer physics was ascertained. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Thickness dependences of optical constants for thin layers of some metals and semiconductors Article published earlier |
| spellingShingle | Thickness dependences of optical constants for thin layers of some metals and semiconductors Kovalenko, S.A. Lisitsa, M.P. |
| title | Thickness dependences of optical constants for thin layers of some metals and semiconductors |
| title_full | Thickness dependences of optical constants for thin layers of some metals and semiconductors |
| title_fullStr | Thickness dependences of optical constants for thin layers of some metals and semiconductors |
| title_full_unstemmed | Thickness dependences of optical constants for thin layers of some metals and semiconductors |
| title_short | Thickness dependences of optical constants for thin layers of some metals and semiconductors |
| title_sort | thickness dependences of optical constants for thin layers of some metals and semiconductors |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/119328 |
| work_keys_str_mv | AT kovalenkosa thicknessdependencesofopticalconstantsforthinlayersofsomemetalsandsemiconductors AT lisitsamp thicknessdependencesofopticalconstantsforthinlayersofsomemetalsandsemiconductors |