Thickness dependences of optical constants for thin layers of some metals and semiconductors
The review comprises investigations devoted to determination of refractive index and absorption coefficient dependences on thickness for thin films of metals and atomic semiconductors. It has been shown that erroneous results were obtained in many papers and correct interpretation of the latter is...
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Datum: | 2001 |
| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2001
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/119328 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Thickness dependences of optical constants for thin layers of some metals and semiconductors / S.A. Kovalenko, M.P. Lisitsa // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 4. — С. 352-357. — Бібліогр.: 13 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
nasplib_isofts_kiev_ua-123456789-119328 |
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Kovalenko, S.A. Lisitsa, M.P. 2017-06-06T12:58:28Z 2017-06-06T12:58:28Z 2001 Thickness dependences of optical constants for thin layers of some metals and semiconductors / S.A. Kovalenko, M.P. Lisitsa // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 4. — С. 352-357. — Бібліогр.: 13 назв. — англ. 1560-8034 PACS: 78.66 https://nasplib.isofts.kiev.ua/handle/123456789/119328 The review comprises investigations devoted to determination of refractive index and absorption coefficient dependences on thickness for thin films of metals and atomic semiconductors. It has been shown that erroneous results were obtained in many papers and correct interpretation of the latter is absent. The reason that braked the solution of the problem of dimensional optical phenomena in thin layer physics was ascertained. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Thickness dependences of optical constants for thin layers of some metals and semiconductors Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Thickness dependences of optical constants for thin layers of some metals and semiconductors |
| spellingShingle |
Thickness dependences of optical constants for thin layers of some metals and semiconductors Kovalenko, S.A. Lisitsa, M.P. |
| title_short |
Thickness dependences of optical constants for thin layers of some metals and semiconductors |
| title_full |
Thickness dependences of optical constants for thin layers of some metals and semiconductors |
| title_fullStr |
Thickness dependences of optical constants for thin layers of some metals and semiconductors |
| title_full_unstemmed |
Thickness dependences of optical constants for thin layers of some metals and semiconductors |
| title_sort |
thickness dependences of optical constants for thin layers of some metals and semiconductors |
| author |
Kovalenko, S.A. Lisitsa, M.P. |
| author_facet |
Kovalenko, S.A. Lisitsa, M.P. |
| publishDate |
2001 |
| language |
English |
| container_title |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| format |
Article |
| description |
The review comprises investigations devoted to determination of refractive index and absorption coefficient dependences on thickness for thin films of metals and atomic semiconductors.
It has been shown that erroneous results were obtained in many papers and correct interpretation of the latter is absent. The reason that braked the solution of the problem of dimensional optical phenomena in thin layer physics was ascertained.
|
| issn |
1560-8034 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/119328 |
| citation_txt |
Thickness dependences of optical constants for thin layers of some metals and semiconductors / S.A. Kovalenko, M.P. Lisitsa // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 4. — С. 352-357. — Бібліогр.: 13 назв. — англ. |
| work_keys_str_mv |
AT kovalenkosa thicknessdependencesofopticalconstantsforthinlayersofsomemetalsandsemiconductors AT lisitsamp thicknessdependencesofopticalconstantsforthinlayersofsomemetalsandsemiconductors |
| first_indexed |
2025-12-07T21:06:20Z |
| last_indexed |
2025-12-07T21:06:20Z |
| _version_ |
1850885097513811968 |