Ivanov, Z., Fogel, N., Yuzephovich, O., Stepantsov, E., & Tzalenchuk, A. (2004). Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions. Физика низких температур.
Chicago Style (17th ed.) CitationIvanov, Z.G, N.Ya Fogel, O.I Yuzephovich, E.A Stepantsov, and A.Ya Tzalenchuk. "Depairing Critical Currents and Self-magnetic Field Effects in Submicron YBa₂Cu₃O₇₋δ Microbridges and Bicrystal Junctions." Физика низких температур 2004.
MLA (8th ed.) CitationIvanov, Z.G, et al. "Depairing Critical Currents and Self-magnetic Field Effects in Submicron YBa₂Cu₃O₇₋δ Microbridges and Bicrystal Junctions." Физика низких температур, 2004.
Warning: These citations may not always be 100% accurate.