Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions

We report on depairing critical currents in submicron YBa₂Cu₃O₇₋δ microbridges. A small-angle bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by a transport current and their influence on the I–V curves. The interplay between the depairing and the vo...

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Veröffentlicht in:Физика низких температур
Datum:2004
Hauptverfasser: Ivanov, Z.G., Fogel, N.Ya., Yuzephovich, O.I., Stepantsov, E.A., Tzalenchuk, A.Ya.
Format: Artikel
Sprache:English
Veröffentlicht: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2004
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Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/119474
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Zitieren:Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇δ microbridges and bicrystal junctions / Z.G. Ivanov, N.Ya. Fogel, O.I. Yuzephovich, E.A. Stepantsov A.Ya. Tzalenchuk // Физика низких температур. — 2004. — Т. 30, № 3. — С. 276-281. — Бібліогр.: 12 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-119474
record_format dspace
spelling Ivanov, Z.G.
Fogel, N.Ya.
Yuzephovich, O.I.
Stepantsov, E.A.
Tzalenchuk, A.Ya.
2017-06-07T04:35:30Z
2017-06-07T04:35:30Z
2004
Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇δ microbridges and bicrystal junctions / Z.G. Ivanov, N.Ya. Fogel, O.I. Yuzephovich, E.A. Stepantsov A.Ya. Tzalenchuk // Физика низких температур. — 2004. — Т. 30, № 3. — С. 276-281. — Бібліогр.: 12 назв. — англ.
0132-6414
PACS: 74.60.Jg, 74.60.Ec, 74.72.Bk
https://nasplib.isofts.kiev.ua/handle/123456789/119474
We report on depairing critical currents in submicron YBa₂Cu₃O₇₋δ microbridges. A small-angle bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by a transport current and their influence on the I–V curves. The interplay between the depairing and the vortex motion determines a crossover in the temperature dependence of the critical current. The high entrance field of vortices in very narrow superconducting channels creates the possibility of carrying a critical current close to the depairing limit determined by the S–S–S nature of the small-angle grain boundary junction.
Discussions with R.I. Shekhter and L.Yu. Gorelik are gratefully acknowledged. The project utilized the Swedish Nanometer Laboratory and was supported by the Materials consortium on superconductivity.
en
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
Физика низких температур
Свеpхпpоводимость, в том числе высокотемпеpатуpная
Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions
spellingShingle Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions
Ivanov, Z.G.
Fogel, N.Ya.
Yuzephovich, O.I.
Stepantsov, E.A.
Tzalenchuk, A.Ya.
Свеpхпpоводимость, в том числе высокотемпеpатуpная
title_short Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions
title_full Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions
title_fullStr Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions
title_full_unstemmed Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions
title_sort depairing critical currents and self-magnetic field effects in submicron yba₂cu₃o₇₋δ microbridges and bicrystal junctions
author Ivanov, Z.G.
Fogel, N.Ya.
Yuzephovich, O.I.
Stepantsov, E.A.
Tzalenchuk, A.Ya.
author_facet Ivanov, Z.G.
Fogel, N.Ya.
Yuzephovich, O.I.
Stepantsov, E.A.
Tzalenchuk, A.Ya.
topic Свеpхпpоводимость, в том числе высокотемпеpатуpная
topic_facet Свеpхпpоводимость, в том числе высокотемпеpатуpная
publishDate 2004
language English
container_title Физика низких температур
publisher Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
format Article
description We report on depairing critical currents in submicron YBa₂Cu₃O₇₋δ microbridges. A small-angle bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by a transport current and their influence on the I–V curves. The interplay between the depairing and the vortex motion determines a crossover in the temperature dependence of the critical current. The high entrance field of vortices in very narrow superconducting channels creates the possibility of carrying a critical current close to the depairing limit determined by the S–S–S nature of the small-angle grain boundary junction.
issn 0132-6414
url https://nasplib.isofts.kiev.ua/handle/123456789/119474
citation_txt Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇δ microbridges and bicrystal junctions / Z.G. Ivanov, N.Ya. Fogel, O.I. Yuzephovich, E.A. Stepantsov A.Ya. Tzalenchuk // Физика низких температур. — 2004. — Т. 30, № 3. — С. 276-281. — Бібліогр.: 12 назв. — англ.
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