Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions

• Published in: Физика низких температур
• Date: 2004
• Main Authors: Ivanov, Z.G., Fogel, N.Ya., Yuzephovich, O.I., Stepantsov, E.A., Tzalenchuk, A.Ya.
• Format: Article
• Language: English
• Published: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2004
• Subjects: Свеpхпpоводимость, в том числе высокотемпеpатуpная
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/119474
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇δ microbridges and bicrystal junctions / Z.G. Ivanov, N.Ya. Fogel, O.I. Yuzephovich, E.A. Stepantsov A.Ya. Tzalenchuk // Физика низких температур. — 2004. — Т. 30, № 3. — С. 276-281. — Бібліогр.: 12 назв. — англ.

We report on depairing critical currents in submicron YBa₂Cu₃O₇₋δ microbridges. A small-angle bicrystal grain boundary junction is used as a tool to study the entrance of vortices induced by a transport current and their influence on the I–V curves. The interplay between the depairing and the vo...