XRD method for the determination of internal stresses in KDP crystals and their relationship to the anomalous biaxiality

• Veröffentlicht in: Functional Materials
• Datum: 2015
• Hauptverfasser: Puzikov, V.M., Tkachenko, V.F., Tsurikov, V.A.
• Format: Artikel
• Sprache: Englisch
• Veröffentlicht: НТК «Інститут монокристалів» НАН України 2015
• Schlagworte: Devices and instruments
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/119559
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: XRD method for the determination of internal stresses in KDP crystals and their relationship to the anomalous biaxiality / V.M. Puzikov, V.F. Tkachenko, V.A. Tsurikov // Functional Materials. — 2015. — Т. 22, № 3. — С. 402-407. — Бібліогр.: 17 назв. — англ.

Designed precision method for determining residual stresses in crystals of the KDP on the relative displacement of the rocking curves (RC), caused by the presence of tensile stress, compression from the {110} or {101}, with the asymmetric geometry of the shooting at the reflection. The error in dete...