APA (7th ed.) Citation

Tkach, V. (2002). Divergent-beam X-ray structural studies of a disturbed surface layer in silicon plates. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Tkach, V.N. "Divergent-beam X-ray Structural Studies of a Disturbed Surface Layer in Silicon Plates." Semiconductor Physics Quantum Electronics & Optoelectronics 2002.

MLA (8th ed.) Citation

Tkach, V.N. "Divergent-beam X-ray Structural Studies of a Disturbed Surface Layer in Silicon Plates." Semiconductor Physics Quantum Electronics & Optoelectronics, 2002.

Warning: These citations may not always be 100% accurate.