Perspectives of development of X-ray analysis for material composition
Perspectives are considered for increasing the sensitivity of X-ray analysis and broadening the range of measurements toward chemical elements with small atomic numbers up to hydrogen at the expense of formation of the optimized selective spectrum from a preliminary beam for exciting fluorescence an...
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| Veröffentlicht in: | Functional Materials |
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| Datum: | 2016 |
| ISSN: | 1027-5495 |
| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | Englisch |
| Veröffentlicht: |
НТК «Інститут монокристалів» НАН України
2016
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| Schlagworte: | |
| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/119712 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Perspectives of development of X-ray analysis for material composition / I.F. Mikhailov, A.A. Baturin, A.I. Mikhailov, L.P. Fomina // Functional Materials. — 2016. — Т. 23, № 1. — С. 5-14. — Бібліогр.: 14 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| Zusammenfassung: | Perspectives are considered for increasing the sensitivity of X-ray analysis and broadening the range of measurements toward chemical elements with small atomic numbers up to hydrogen at the expense of formation of the optimized selective spectrum from a preliminary beam for exciting fluorescence and observing scattering peaks and diffraction reflections. It has been shown that low-power preliminary sources (X-ray tube, 20 W) are able to provide the detection limit for trace impurities near 0.1 ppm, and for hydrogen in metals - up to 10 ppm. The data presented are hopeful for attaining X-ray analysis sensitivity at the level of ppb units due to application of powerful preliminary beams (synchrotron, undulators, wigglers, etc.).
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| ISSN: | 1027-5495 |